Inventor
GOISHI MASARU
JP16 patents
⚠️ This page may combine multiple inventors who share the name “GOISHI MASARU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANTEST CORP
8 patentsUS6061813AMay 9, 2000
Memory test set
ADVANTEST CORP27 citations91
US8362791B2Jan 29, 2013
Test apparatus additional module and test method
ADVANTEST CORP8 citations81
US6249533B1Jun 19, 2001
Pattern generator
ADVANTEST CORP7 citations72
US7363566B2Apr 22, 2008
Pattern generator and test apparatus
ADVANTEST CORP6 citations61
US7336714B2Feb 26, 2008
Phase adjustment apparatus and semiconductor test apparatus
ADVANTEST CORP4 citations61
US7236903B2Jun 26, 2007
Test apparatus and control method
ADVANTEST CORP2 citations61
US7623984B2Nov 24, 2009
Test apparatus and electronic device
ADVANTEST CORP0 citations40
US7539592B2May 26, 2009
Test apparatus and electronic device
ADVANTEST CORP0 citations40
ISHIKAWA SHINICHI
6 patentsUS8666691B2Mar 4, 2014
Test apparatus and test method
ISHIKAWA SHINICHI8 citations81
US8149721B2Apr 3, 2012
Test apparatus and test method
ISHIKAWA SHINICHI2 citations60
US8743702B2Jun 3, 2014
Test apparatus and test method
ISHIKAWA SHINICHI0 citations40
US8692566B2Apr 8, 2014
Test apparatus and test method
ISHIKAWA SHINICHI0 citations40
US8483073B2Jul 9, 2013
Test apparatus and test method
ISHIKAWA SHINICHI0 citations40
US8165027B2Apr 24, 2012
Test apparatus and test method
ISHIKAWA SHINICHI0 citations40