Inventor
NAKAYAMA HIROYASU
JP17 patents
⚠️ This page may combine multiple inventors who share the name “NAKAYAMA HIROYASU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANTEST CORP
8 patentsUS6587983B1Jul 1, 2003
Apparatus and method of testing a semiconductor device
ADVANTEST CORP26 citations92
US5903745AMay 11, 1999
Timing generator for plural reference clocks
ADVANTEST CORP21 citations92
US8362791B2Jan 29, 2013
Test apparatus additional module and test method
ADVANTEST CORP8 citations81
US6604058B2Aug 5, 2003
Semiconductor device testing apparatus and method for testing semiconductor device
ADVANTEST CORP9 citations73
US6058486AMay 2, 2000
Timing generator for plural reference clock frequencies
ADVANTEST CORP12 citations73
US7472327B2Dec 30, 2008
Pattern generator and test apparatus
ADVANTEST CORP2 citations62
US7015685B2Mar 21, 2006
Semiconductor tester
ADVANTEST CORP4 citations62
US7235995B2Jun 26, 2007
Test apparatus and testing method
ADVANTEST CORP1 citations49
ISHIKAWA SHINICHI
6 patentsUS8666691B2Mar 4, 2014
Test apparatus and test method
ISHIKAWA SHINICHI8 citations81
US8149721B2Apr 3, 2012
Test apparatus and test method
ISHIKAWA SHINICHI2 citations60
US8743702B2Jun 3, 2014
Test apparatus and test method
ISHIKAWA SHINICHI0 citations40
US8692566B2Apr 8, 2014
Test apparatus and test method
ISHIKAWA SHINICHI0 citations40
US8483073B2Jul 9, 2013
Test apparatus and test method
ISHIKAWA SHINICHI0 citations40
US8165027B2Apr 24, 2012
Test apparatus and test method
ISHIKAWA SHINICHI0 citations40