Inventor
TSUTO MASARU
JP18 patents
⚠️ This page may combine multiple inventors who share the name “TSUTO MASARU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANTEST CORP
10 patentsUS6769083B1Jul 27, 2004
Test pattern generator, a testing device, and a method of generating a plurality of test patterns
ADVANTEST CORP35 citations92
US6484282B1Nov 19, 2002
Test pattern generator, a memory testing device, and a method of generating a plurality of test patterns
ADVANTEST CORP27 citations92
US8362791B2Jan 29, 2013
Test apparatus additional module and test method
ADVANTEST CORP8 citations81
US6678852B2Jan 13, 2004
Semiconductor device testing apparatus
ADVANTEST CORP7 citations73
US6601204B1Jul 29, 2003
Pattern generating method, pattern generator using the method, and memory tester using the pattern generator
ADVANTEST CORP10 citations73
US6499126B1Dec 24, 2002
Pattern generator and electric part testing apparatus
ADVANTEST CORP13 citations73
US6138259AOct 24, 2000
Semiconductor memory testing apparatus
ADVANTEST CORP10 citations73
US6032275AFeb 29, 2000
Test pattern generator
ADVANTEST CORP9 citations73
US6363022B2Mar 26, 2002
Semiconductor memory device tester
ADVANTEST CORP6 citations62
US5850402ADec 15, 1998
Test pattern generator
ADVANTEST CORP1 citations51
ISHIKAWA SHINICHI
6 patentsUS8666691B2Mar 4, 2014
Test apparatus and test method
ISHIKAWA SHINICHI8 citations81
US8149721B2Apr 3, 2012
Test apparatus and test method
ISHIKAWA SHINICHI2 citations60
US8743702B2Jun 3, 2014
Test apparatus and test method
ISHIKAWA SHINICHI0 citations40
US8692566B2Apr 8, 2014
Test apparatus and test method
ISHIKAWA SHINICHI0 citations40
US8483073B2Jul 9, 2013
Test apparatus and test method
ISHIKAWA SHINICHI0 citations40
US8165027B2Apr 24, 2012
Test apparatus and test method
ISHIKAWA SHINICHI0 citations40