Inventor
KANEYAMA TOSHIKATSU
JP13 patents
Patents
13 patentsUS6720558B2Apr 13, 2004
Transmission electron microscope equipped with energy filter
JEOL LTD13 citations82
US6483110B1Nov 19, 2002
Electron beam energy filter
JEOL LTD8 citations72
US5258617ANov 2, 1993
Method and apparatus for correcting axial coma in electron microscopy
JEOL LTD17 citations72
US10879035B2Dec 29, 2020
Scanning electron microscope and measurement method for obtaining images of a specimen using an ion beam and an electron beam
JEOL LTD3 citations71
US5264705ANov 23, 1993
Specimen-driving apparatus for electron microscope which tilts and translates while preventing contact damage
JEOL LTD12 citations70
US7459680B2Dec 2, 2008
Method of analysis using energy loss spectrometer and transmission electron microscope equipped therewith
JEOL LTD5 citations61
US7030389B2Apr 18, 2006
Electron beam apparatus having electron analyzer and method of controlling lenses
JEOL LTD4 citations61
US6586737B2Jul 1, 2003
Transmission electron microscope equipped with energy filter
JEOL LTD2 citations61
US5952656ASep 14, 1999
Energy filter
JEOL LTD5 citations61
US6140642AOct 31, 2000
Imaging energy filter equipped with distortion corrector
JEOL LTD5 citations60
US6573501B2Jun 3, 2003
Holography transmission electron microscope
JEOL LTD5 citations58
US7977630B2Jul 12, 2011
Electron microscope
JEOL LTD0 citations51
US11640894B2May 2, 2023
Charged particle beam apparatus and control method of charged particle beam apparatus
JEOL LTD0 citations50