Inventor
TAKAHASHI HIRONORI
JP121 patents
⚠️ This page may combine multiple inventors who share the name “TAKAHASHI HIRONORI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HAMAMATSU PHOTONICS KK
36 patentsUS6747736B2Jun 8, 2004
Terahertz wave spectrometer
HAMAMATSU PHOTONICS KK58 citations96
US5034683AJul 23, 1991
Voltage detecting device
HAMAMATSU PHOTONICS KK51 citations96
US9612153B2Apr 4, 2017
Electric field vector detection method and electric field vector detection device
HAMAMATSU PHOTONICS KK23 citations94
US5896035AApr 20, 1999
Electric field measuring apparatus
HAMAMATSU PHOTONICS KK24 citations93
US5767688AJun 16, 1998
Electro-optic voltage measurement apparatus
HAMAMATSU PHOTONICS KK26 citations93
US5179565AJan 12, 1993
Low noise pulsed light source utilizing laser diode and voltage detector device utilizing same low noise pulsed light source
HAMAMATSU PHOTONICS KK51 citations93
US5055770AOct 8, 1991
Method and apparatus for detecting voltage
HAMAMATSU PHOTONICS KK22 citations93
US4906922AMar 6, 1990
Voltage mapping device having fast time resolution
HAMAMATSU PHOTONICS KK40 citations93
US4866372ASep 12, 1989
Voltage detector having compensation for polarization change caused by spontaneous birefringence
HAMAMATSU PHOTONICS KK29 citations93
US5585735ADec 17, 1996
E-O probe with FOP and voltage detecting apparatus using the E-O probe
HAMAMATSU PHOTONICS KK19 citations92
US5583444ADec 10, 1996
Voltage detection apparatus
HAMAMATSU PHOTONICS KK33 citations92
US5552716ASep 3, 1996
Method of positioning an electrooptic probe of an apparatus for the measurement of voltage
HAMAMATSU PHOTONICS KK53 citations92
US5499190AMar 12, 1996
System for measuring timing relationship between two signals
HAMAMATSU PHOTONICS KK30 citations92
US5128950AJul 7, 1992
Low noise pulsed light source using laser diode
HAMAMATSU PHOTONICS KK21 citations82
US4968881ANov 6, 1990
Voltage detector using electro-optic material having anti-reflective coatings
HAMAMATSU PHOTONICS KK21 citations80
US5847570ADec 8, 1998
Low jitter trigger circuit for electro-optic probing apparatus
HAMAMATSU PHOTONICS KK7 citations74
US5751419AMay 12, 1998
Optical delay apparatus
HAMAMATSU PHOTONICS KK10 citations74
US5631555AMay 20, 1997
Voltage measurement system
HAMAMATSU PHOTONICS KK8 citations74
US5621521AApr 15, 1997
Checking apparatus for array electrode substrate
HAMAMATSU PHOTONICS KK13 citations74
US5546011AAug 13, 1996
Voltage measuring apparatus
HAMAMATSU PHOTONICS KK12 citations74
US5479106ADec 26, 1995
Electro-optic voltage detector
HAMAMATSU PHOTONICS KK18 citations74
US5420686AMay 30, 1995
Polarization interferometer optical voltage detector utilizing movement of interference fringe
HAMAMATSU PHOTONICS KK8 citations74
US5153667AOct 6, 1992
Apparatus for detecting the change of light intensity
HAMAMATSU PHOTONICS KK17 citations74
US5082340AJan 21, 1992
Wavelength converting device
HAMAMATSU PHOTONICS KK14 citations74
US5043568AAug 27, 1991
Optical signal detector incorporating means for eluminating background light
HAMAMATSU PHOTONICS KK10 citations74
US4996475AFeb 26, 1991
Electro-optic voltage detector having a transparent electrode
HAMAMATSU PHOTONICS KK12 citations74
US4982152AJan 1, 1991
Voltage detecting device
HAMAMATSU PHOTONICS KK9 citations74
US4982151AJan 1, 1991
Voltage measuring apparatus
HAMAMATSU PHOTONICS KK13 citations74
US5592101AJan 7, 1997
Electro-optic apparatus for measuring an electric field of a sample
HAMAMATSU PHOTONICS KK7 citations73
US5237388AAug 17, 1993
Polarized light measuring apparatus and phase plate measuring apparatus
HAMAMATSU PHOTONICS KK10 citations73
US10248003B2Apr 2, 2019
Non-linear optical crystal and method for manufacturing same, and terahertz-wave generator and terahertz-wave measuring apparatus
HAMAMATSU PHOTONICS KK2 citations72
US10082720B2Sep 25, 2018
Wavelength conversion element and wavelength conversion light pulse waveform shaping device
HAMAMATSU PHOTONICS KK2 citations72
US5666062ASep 9, 1997
Voltage measuring using electro-optic material's change in refractive index
HAMAMATSU PHOTONICS KK7 citations72
US5642040AJun 24, 1997
Electrooptic probe for measuring voltage of an object having a high permittivity film fixed on an end face of a reflecting film fixed on an electrooptic material
HAMAMATSU PHOTONICS KK8 citations71
US4962353AOct 9, 1990
Voltage detector
HAMAMATSU PHOTONICS KK9 citations70
US8354644B2Jan 15, 2013
Total reflection tera hertz wave measuring apparatus
HAMAMATSU PHOTONICS KK3 citations63
NGK INSULATORS LTD
5 patentsUS7500847B2Mar 10, 2009
Die for forming honeycomb structure and method of manufacturing the same
NGK INSULATORS LTD8 citations83
US11219100B2Jan 4, 2022
Fluid heating component, fluid heating component complex, and manufacturing method of fluid heating component
NGK INSULATORS LTD2 citations73
US10619938B2Apr 14, 2020
Heat exchange member
NGK INSULATORS LTD2 citations73
US11994053B2May 28, 2024
Electrically heating converter and electrically heating support
NGK INSULATORS LTD0 citations63
US11310873B2Apr 19, 2022
Fluid heating component, and fluid heating component complex
NGK INSULATORS LTD0 citations63
KYOCERA DOCUMENT SOLUTIONS INC
3 patentsUS9411273B1Aug 9, 2016
Fixing device and image forming apparatus
KYOCERA DOCUMENT SOLUTIONS INC9 citations84
US9061850B2Jun 23, 2015
Fixing device, image forming apparatus, and sheet detecting mechanism
KYOCERA DOCUMENT SOLUTIONS INC5 citations73
US12050422B2Jul 30, 2024
Fixing device and image forming apparatus
KYOCERA DOCUMENT SOLUTIONS INC2 citations72
KYOCERA MITA CORP
2 patentsKAWADA YOICHI
1 patentTAKAHASHI HIRONORI
1 patentJAPAN SCIENCE & TECH AGENCY
1 patentSHIMANO KK
1 patentShowing the top 50 of 121 patents by PatentIndex Score.