Inventor
KIM JONG MUN
US22 patents
⚠️ This page may combine multiple inventors who share the name “KIM JONG MUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
17 patentsUS9269587B2Feb 23, 2016
Methods for etching materials using synchronized RF pulses
APPLIED MATERIALS INC8 citations83
US7807064B2Oct 5, 2010
Halogen-free amorphous carbon mask etch having high selectivity to photoresist
APPLIED MATERIALS INC8 citations83
US9909213B2Mar 6, 2018
Recursive pumping for symmetrical gas exhaust to control critical dimension uniformity in plasma reactors
APPLIED MATERIALS INC3 citations70
US9748366B2Aug 29, 2017
Etching oxide-nitride stacks using C4F6H2
APPLIED MATERIALS INC2 citations69
US12201030B2Jan 14, 2025
Spin-orbit torque MRAM structure and manufacture thereof
APPLIED MATERIALS INC0 citations62
US11723283B2Aug 8, 2023
Spin-orbit torque MRAM structure and manufacture thereof
APPLIED MATERIALS INC0 citations62
US11289342B2Mar 29, 2022
Damage free metal conductor formation
APPLIED MATERIALS INC0 citations62
US11145808B2Oct 12, 2021
Methods for etching a structure for MRAM applications
APPLIED MATERIALS INC0 citations62
US10964527B2Mar 30, 2021
Residual removal
APPLIED MATERIALS INC0 citations62
US10957548B2Mar 23, 2021
Method of etching copper indium gallium selenide (CIGS) material
APPLIED MATERIALS INC0 citations62
US10685849B1Jun 16, 2020
Damage free metal conductor formation
APPLIED MATERIALS INC1 citations62
US11384428B2Jul 12, 2022
Carbon layer covered mask in 3D applications
APPLIED MATERIALS INC0 citations60
US10643854B2May 5, 2020
Silicon dioxide-polysilicon multi-layered stack etching with plasma etch chamber employing non-corrosive etchants
APPLIED MATERIALS INC0 citations52
US9589832B2Mar 7, 2017
Maintaining mask integrity to form openings in wafers
APPLIED MATERIALS INC1 citations52
US9299574B2Mar 29, 2016
Silicon dioxide-polysilicon multi-layered stack etching with plasma etch chamber employing non-corrosive etchants
APPLIED MATERIALS INC0 citations52
US10692734B2Jun 23, 2020
Methods of patterning nickel silicide layers on a semiconductor device
APPLIED MATERIALS INC0 citations51
US9305804B2Apr 5, 2016
Plasma etch processes for opening mask layers
APPLIED MATERIALS INC1 citations42
KIM JONG MUN
2 patentsUS8187415B2May 29, 2012
Plasma etch reactor with distribution of etch gases across a wafer surface and a polymer oxidizing gas in an independently fed center gas zone
KIM JONG MUN20 citations82
US8778207B2Jul 15, 2014
Plasma etch processes for boron-doped carbonaceous mask layers
KIM JONG MUN3 citations55