P

Inventor

KIM JONG MUN

US22 patents
⚠️ This page may combine multiple inventors who share the name “KIM JONG MUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

17 patents
US9269587B2Feb 23, 2016

Methods for etching materials using synchronized RF pulses

APPLIED MATERIALS INC8 citations83
US7807064B2Oct 5, 2010

Halogen-free amorphous carbon mask etch having high selectivity to photoresist

APPLIED MATERIALS INC8 citations83
US9909213B2Mar 6, 2018

Recursive pumping for symmetrical gas exhaust to control critical dimension uniformity in plasma reactors

APPLIED MATERIALS INC3 citations70
US9748366B2Aug 29, 2017

Etching oxide-nitride stacks using C4F6H2

APPLIED MATERIALS INC2 citations69
US12201030B2Jan 14, 2025

Spin-orbit torque MRAM structure and manufacture thereof

APPLIED MATERIALS INC0 citations62
US11723283B2Aug 8, 2023

Spin-orbit torque MRAM structure and manufacture thereof

APPLIED MATERIALS INC0 citations62
US11289342B2Mar 29, 2022

Damage free metal conductor formation

APPLIED MATERIALS INC0 citations62
US11145808B2Oct 12, 2021

Methods for etching a structure for MRAM applications

APPLIED MATERIALS INC0 citations62
US10964527B2Mar 30, 2021

Residual removal

APPLIED MATERIALS INC0 citations62
US10957548B2Mar 23, 2021

Method of etching copper indium gallium selenide (CIGS) material

APPLIED MATERIALS INC0 citations62
US10685849B1Jun 16, 2020

Damage free metal conductor formation

APPLIED MATERIALS INC1 citations62
US11384428B2Jul 12, 2022

Carbon layer covered mask in 3D applications

APPLIED MATERIALS INC0 citations60
US10643854B2May 5, 2020

Silicon dioxide-polysilicon multi-layered stack etching with plasma etch chamber employing non-corrosive etchants

APPLIED MATERIALS INC0 citations52
US9589832B2Mar 7, 2017

Maintaining mask integrity to form openings in wafers

APPLIED MATERIALS INC1 citations52
US9299574B2Mar 29, 2016

Silicon dioxide-polysilicon multi-layered stack etching with plasma etch chamber employing non-corrosive etchants

APPLIED MATERIALS INC0 citations52
US10692734B2Jun 23, 2020

Methods of patterning nickel silicide layers on a semiconductor device

APPLIED MATERIALS INC0 citations51
US9305804B2Apr 5, 2016

Plasma etch processes for opening mask layers

APPLIED MATERIALS INC1 citations42

KIM JONG MUN

2 patents

DOAN KENNY LINH

2 patents

SHIMIZU DAISUKE

1 patent