Inventor

RYU SUNG YOON

KR19 patents

⚠️ This page may combine multiple inventors who share the name “RYU SUNG YOON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

RYU SUNG YOON

SAMSUNG ELECTRONICS CO LTD

Broadband light source and optical inspector having the same

Spectral ellipsometry measurement and data analysis device and related systems and methods

Method of inspecting surface and method of manufacturing semiconductor device

Surface inspecting method

Method of manufacturing a semiconductor device using semiconductor measurement system

Method for measuring semiconductor device

Method of inspecting surface and method of manufacturing semiconductor device

Defect inspection method and defect inspection apparatus

Method of inspecting semiconductor wafer, inspection system for performing the same, and method of fabricating semiconductor device using the same

Optical module, spectroscopic device for hyperspectral imaging, and imaging measurement method using the same

Mass flow controller, apparatus for manufacturing semiconductor device, and method for maintenance thereof

Apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin film

Method and system for inspecting semiconductor wafer and method of fabricating semiconductor device using the same

Thickness prediction network learning method, semiconductor device manufacturing method, and semiconductor material deposition equipment

Method of inspecting semiconductor wafer, an inspection system for performing the same, and a method of fabricating semiconductor device using the same

Scanning probe inspector

Apparatus and method for measuring thickness

KOREA ADVANCED INST SCI & TECH

Device which produces various types of pulses by controlling the distance between the saturable absorber connectors

Single walled carbon nanotube saturable absorber production via multi-vacuum filtration method