Inventor
PAK JAMES
US18 patents
⚠️ This page may combine multiple inventors who share the name “PAK JAMES”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CYPRESS SEMICONDUCTOR CORP
14 patentsUS9853039B1Dec 26, 2017
Split-gate flash cell formed on recessed substrate
CYPRESS SEMICONDUCTOR CORP16 citations92
US10014380B2Jul 3, 2018
Memory first process flow and device
CYPRESS SEMICONDUCTOR CORP4 citations84
US10068912B1Sep 4, 2018
Method of reducing charge loss in non-volatile memories
CYPRESS SEMICONDUCTOR CORP8 citations80
US12029041B2Jul 2, 2024
Method of forming high-voltage transistor with thin gate poly
CYPRESS SEMICONDUCTOR CORP1 citations73
US10872898B2Dec 22, 2020
Embedded non-volatile memory device and fabrication method of the same
CYPRESS SEMICONDUCTOR CORP4 citations73
US10242996B2Mar 26, 2019
Method of forming high-voltage transistor with thin gate poly
CYPRESS SEMICONDUCTOR CORP1 citations73
US9917166B2Mar 13, 2018
Memory first process flow and device
CYPRESS SEMICONDUCTOR CORP3 citations73
US11690227B2Jun 27, 2023
Method of forming high-voltage transistor with thin gate poly
CYPRESS SEMICONDUCTOR CORP0 citations62
US11342429B2May 24, 2022
Memory first process flow and device
CYPRESS SEMICONDUCTOR CORP0 citations62
US10957703B2Mar 23, 2021
Method of reducing charge loss in non-volatile memories
CYPRESS SEMICONDUCTOR CORP0 citations58
US10818761B2Oct 27, 2020
Memory first process flow and device
CYPRESS SEMICONDUCTOR CORP0 citations52
US10497710B2Dec 3, 2019
Split-gate flash cell formed on recessed substrate
CYPRESS SEMICONDUCTOR CORP0 citations52
US10403731B2Sep 3, 2019
Memory first process flow and device
CYPRESS SEMICONDUCTOR CORP0 citations52
US10679712B2Jun 9, 2020
Non-volatile memory device and method of blank check
CYPRESS SEMICONDUCTOR CORP0 citations47
ADVANCED MICRO DEVICES INC
2 patentsUS5930138AJul 27, 1999
Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs
ADVANCED MICRO DEVICES INC85 citations96
US5716856AFeb 10, 1998
Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs
ADVANCED MICRO DEVICES INC17 citations92