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Inventor

VELLAIKAL MANOJ

US19 patents
⚠️ This page may combine multiple inventors who share the name “VELLAIKAL MANOJ”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

16 patents
US7628897B2Dec 8, 2009

Reactive ion etching for semiconductor device feature topography modification

APPLIED MATERIALS INC230 citations98
US7205240B2Apr 17, 2007

HDP-CVD multistep gapfill process

APPLIED MATERIALS INC114 citations95
US6413871B2Jul 2, 2002

Nitrogen treatment of polished halogen-doped silicon glass

APPLIED MATERIALS INC40 citations92
US6410457B1Jun 25, 2002

Method for improving barrier layer adhesion to HDP-FSG thin films

APPLIED MATERIALS INC17 citations92
US9870921B2Jan 16, 2018

Cleaning method

APPLIED MATERIALS INC6 citations83
US7867921B2Jan 11, 2011

Reduction of etch-rate drift in HDP processes

APPLIED MATERIALS INC7 citations83
US7745350B2Jun 29, 2010

Impurity control in HDP-CVD DEP/ETCH/DEP processes

APPLIED MATERIALS INC13 citations83
US7229931B2Jun 12, 2007

Oxygen plasma treatment for enhanced HDP-CVD gapfill

APPLIED MATERIALS INC16 citations81
US6803325B2Oct 12, 2004

Apparatus for improving barrier layer adhesion to HDP-FSG thin films

APPLIED MATERIALS INC12 citations73
US11087979B2Aug 10, 2021

Cleaning method

APPLIED MATERIALS INC1 citations72
US10199221B2Feb 5, 2019

Cleaning method

APPLIED MATERIALS INC2 citations72
US7329586B2Feb 12, 2008

Gapfill using deposition-etch sequence

APPLIED MATERIALS INC6 citations62
US7659184B2Feb 9, 2010

Plasma immersion ion implantation process with chamber seasoning and seasoning layer plasma discharging for wafer dechucking

APPLIED MATERIALS INC3 citations61
US8927400B2Jan 6, 2015

Safe handling of low energy, high dose arsenic, phosphorus, and boron implanted wafers

APPLIED MATERIALS INC1 citations51
US8003500B2Aug 23, 2011

Plasma immersion ion implantation process with chamber seasoning and seasoning layer plasma discharging for wafer dechucking

APPLIED MATERIALS INC1 citations51
US12356705B2Jul 8, 2025

Electrical contact cavity structure and methods of forming the same

APPLIED MATERIALS INC0 citations47

CHOI DONGWON

1 patent

YAO DAPING

1 patent

SANTHANAM KARTIK

1 patent