Inventor

WANG CHUNG CHIEN

TW10 patents

⚠️ This page may combine multiple inventors who share the name “WANG CHUNG CHIEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

WANG CHUNG CHIEN

3 patents

US8735207B2May 27, 2014

Method to avoid fixed pattern noise within backside illuminated (BSI) complementary metal-oxide-semiconductor (CMOS) sensor array

WANG CHUNG CHIEN5 citations70

US9099389B2Aug 4, 2015

Method and apparatus for reducing stripe patterns

WANG CHUNG CHIEN0 citations50

US8759225B2Jun 24, 2014

Method to form a CMOS image sensor

WANG CHUNG CHIEN0 citations50

TAIWAN SEMICONDUCTOR MFG CO LTD

2 patents

US9418999B2Aug 16, 2016

MIM capacitors with improved reliability

TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84

US10290502B2May 14, 2019

Apparatus for reducing stripe patterns

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73

TAIWAN SEMICONDUCTOR MFG

2 patents

US7851324B2Dec 14, 2010

Method of forming metal-insulator-metal structure

TAIWAN SEMICONDUCTOR MFG4 citations62

US8809098B2Aug 19, 2014

Back side defect reduction for back side illuminated image sensor

TAIWAN SEMICONDUCTOR MFG0 citations52

CHUANG CHUN-CHIEH

1 patent

US8614495B2Dec 24, 2013

Back side defect reduction for back side illuminated image sensor

CHUANG CHUN-CHIEH4 citations62

HSU KAI-CHUN

1 patent

US8304354B2Nov 6, 2012

Methods to avoid laser anneal boundary effect within BSI CMOS image sensor array

HSU KAI-CHUN4 citations57

WU CHIH-TA

1 patent

US8889507B2Nov 18, 2014

MIM capacitors with improved reliability

WU CHIH-TA1 citations45