P

Inventor

HSIAO SHIH-YIN

TW55 patents

Patents

50 patents
US9391196B1Jul 12, 2016

High-voltage metal-oxide-semiconductor transistor device and manufacturing method thereof

UNITED MICROELECTRONICS CORP20 citations91
US10373872B2Aug 6, 2019

Transistor structure

UNITED MICROELECTRONICS CORP5 citations84
US9985129B2May 29, 2018

High-voltage metal-oxide-semiconductor transistor and fabrication method thereof

UNITED MICROELECTRONICS CORP6 citations84
US9761657B2Sep 12, 2017

Metal-oxide-semiconductor transistor and method of forming gate layout

UNITED MICROELECTRONICS CORP8 citations84
US9741850B1Aug 22, 2017

Semiconductor device and method for forming the same

UNITED MICROELECTRONICS CORP12 citations84
US9716139B2Jul 25, 2017

Method for forming high voltage transistor

UNITED MICROELECTRONICS CORP8 citations83
US9406771B1Aug 2, 2016

Semiconductor structure and manufacturing method thereof

UNITED MICROELECTRONICS CORP10 citations83
US10008573B1Jun 26, 2018

High-voltage metal-oxide-semiconductor transistor device

UNITED MICROELECTRONICS CORP7 citations82
US10204996B2Feb 12, 2019

Metal-oxide-semiconductor transistor and method of forming gate layout

UNITED MICROELECTRONICS CORP3 citations73
US9859417B2Jan 2, 2018

High-voltage metal-oxide-semiconductor transistor and fabrication method thereof

UNITED MICROELECTRONICS CORP4 citations73
US9583617B2Feb 28, 2017

Semiconductor device and method of forming the same

UNITED MICROELECTRONICS CORP4 citations73
US10411088B2Sep 10, 2019

Semiconductor device

UNITED MICROELECTRONICS CORP2 citations72
US9972678B2May 15, 2018

Semiconductor device and method of forming the same

UNITED MICROELECTRONICS CORP3 citations72
US9728616B2Aug 8, 2017

High-voltage metal-oxide-semiconductor transistor device and manufacturing method thereof

UNITED MICROELECTRONICS CORP5 citations72
US9577069B1Feb 21, 2017

Method of fabricating semiconductor MOS device

UNITED MICROELECTRONICS CORP5 citations72
US9349818B2May 24, 2016

Metal-oxide-semiconductor transistor device having a drain side dummy contact

UNITED MICROELECTRONICS CORP4 citations72
US10020393B2Jul 10, 2018

Laterally diffused metal-oxide-semiconductor transistor and manufacturing method thereof

UNITED MICROELECTRONICS CORP4 citations71
US9722072B2Aug 1, 2017

Manufacturing method of high-voltage metal-oxide-semiconductor transistor

UNITED MICROELECTRONICS CORP4 citations71
US9570451B1Feb 14, 2017

Method to form semiconductor devices

UNITED MICROELECTRONICS CORP6 citations71
US10297455B2May 21, 2019

Gate oxide structure and method for fabricating the same

UNITED MICROELECTRONICS CORP4 citations69
US9806150B2Oct 31, 2017

High voltage device and method of fabricating the same

UNITED MICROELECTRONICS CORP2 citations68
US9680010B1Jun 13, 2017

High voltage device and method of fabricating the same

UNITED MICROELECTRONICS CORP2 citations68
US9929056B1Mar 27, 2018

Method for forming gate structures in different operation voltages

UNITED MICROELECTRONICS CORP3 citations67
US12087635B2Sep 10, 2024

Transistor structure

UNITED MICROELECTRONICS CORP0 citations62
US11721587B2Aug 8, 2023

Transistor structure

UNITED MICROELECTRONICS CORP0 citations62
US11088027B2Aug 10, 2021

Transistor structure

UNITED MICROELECTRONICS CORP0 citations62
US10903334B2Jan 26, 2021

High voltage semiconductor device and manufacturing method thereof

UNITED MICROELECTRONICS CORP1 citations62
US10373876B2Aug 6, 2019

Method for preventing dishing during the manufacture of semiconductor devices

UNITED MICROELECTRONICS CORP1 citations62
US9461133B1Oct 4, 2016

High voltage metal-oxide-semiconductor transistor device having stepped gate structure and manufacturing method thereof

UNITED MICROELECTRONICS CORP2 citations62
US9196695B2Nov 24, 2015

High-voltage metal-oxide semiconductor transistor and method of fabricating the same

UNITED MICROELECTRONICS CORP3 citations61
US10796964B2Oct 6, 2020

Transistor structure

UNITED MICROELECTRONICS CORP0 citations52
US10629697B2Apr 21, 2020

High voltage semiconductor device and manufacturing method thereof

UNITED MICROELECTRONICS CORP0 citations52
US10290718B2May 14, 2019

Metal-oxide-semiconductor transistor and method of forming gate layout

UNITED MICROELECTRONICS CORP0 citations52
US10147800B2Dec 4, 2018

Method of fabricating a transistor with reduced hot carrier injection effects

UNITED MICROELECTRONICS CORP1 citations52
US9978647B2May 22, 2018

Method for preventing dishing during the manufacture of semiconductor devices

UNITED MICROELECTRONICS CORP1 citations52
US9755046B2Sep 5, 2017

Method of forming semiconductor device

UNITED MICROELECTRONICS CORP0 citations52
US9691911B1Jun 27, 2017

Semiconductor device

UNITED MICROELECTRONICS CORP1 citations52
US9647060B2May 9, 2017

Isolation structure and method for fabricating the same

UNITED MICROELECTRONICS CORP0 citations52
US9490316B2Nov 8, 2016

Semiconductor structure with silicon oxide layer having a top surface in the shape of plural hills and method of fabricating the same

UNITED MICROELECTRONICS CORP0 citations52
US10586735B2Mar 10, 2020

Semiconductor device structure including high voltage MOS device

UNITED MICROELECTRONICS CORP0 citations51
US10373837B2Aug 6, 2019

Memory device

UNITED MICROELECTRONICS CORP0 citations51
US10354878B2Jul 16, 2019

Doping method for semiconductor device

UNITED MICROELECTRONICS CORP0 citations51
US10312379B2Jun 4, 2019

High voltage device

UNITED MICROELECTRONICS CORP0 citations51
US9947746B2Apr 17, 2018

Bipolar junction transistor device and method for fabricating the same

UNITED MICROELECTRONICS CORP0 citations51
US9922881B2Mar 20, 2018

Method for fabricating semiconductor device structure and product thereof

UNITED MICROELECTRONICS CORP0 citations51
US9812327B2Nov 7, 2017

Semiconductor device and method of forming the same

UNITED MICROELECTRONICS CORP0 citations51
US9653558B2May 16, 2017

Semiconductor structure having a dummy contact and manufacturing method thereof

UNITED MICROELECTRONICS CORP0 citations51
US9653343B1May 16, 2017

Method of manufacturing semiconductor device with shallow trench isolation (STI) having edge profile

UNITED MICROELECTRONICS CORP0 citations51
US9484422B2Nov 1, 2016

High-voltage metal-oxide semiconductor transistor

UNITED MICROELECTRONICS CORP0 citations51
US9472661B1Oct 18, 2016

Semiconductor structure

UNITED MICROELECTRONICS CORP1 citations51

Showing the top 50 of 55 patents by PatentIndex Score.