Inventor
MU FUCHEN
US24 patents
⚠️ This page may combine multiple inventors who share the name “MU FUCHEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MU FUCHEN
14 patentsUS8995200B1Mar 31, 2015
Non-volatile memory (NVM) with dynamically adjusted reference current
MU FUCHEN17 citations83
US8879330B1Nov 4, 2014
Non-volatile memory (NVM) with variable verify operations
MU FUCHEN6 citations83
US9142315B2Sep 22, 2015
Methods and systems for adjusting NVM cell bias conditions for read/verify operations to compensate for performance degradation
MU FUCHEN8 citations80
US8830756B2Sep 9, 2014
Dynamic detection method for latent slow-to-erase bit for high performance and high reliability flash memory
MU FUCHEN5 citations73
US9343172B2May 17, 2016
Extended protection for embedded erase of non-volatile memory cells
MU FUCHEN5 citations72
US8964482B2Feb 24, 2015
Dynamic healing of non-volatile memory cells
MU FUCHEN6 citations72
US8947940B2Feb 3, 2015
Structure and method for healing tunnel dielectric of non-volatile memory cells
MU FUCHEN4 citations72
US8902667B2Dec 2, 2014
Methods and systems for adjusting NVM cell bias conditions for program/erase operations to reduce performance degradation
MU FUCHEN5 citations72
US8760923B2Jun 24, 2014
Non-volatile memory (NVM) that uses soft programming
MU FUCHEN5 citations72
US9081708B2Jul 14, 2015
Dynamic read scheme for high reliability high performance flash memory
MU FUCHEN4 citations64
US8713406B2Apr 29, 2014
Erasing a non-volatile memory (NVM) system having error correction code (ECC)
MU FUCHEN2 citations62
US8290759B1Oct 16, 2012
Negative bias temperature instability in dynamic operation of an integrated circuit
MU FUCHEN5 citations62
US8995202B2Mar 31, 2015
Test flow to detect a latent leaky bit of a non-volatile memory
MU FUCHEN2 citations56
US8873316B2Oct 28, 2014
Methods and systems for adjusting NVM cell bias conditions based upon operating temperature to reduce performance degradation
MU FUCHEN1 citations51
FREESCALE SEMICONDUCTOR INC
6 patentsUS8947958B2Feb 3, 2015
Latent slow bit detection for non-volatile memory
FREESCALE SEMICONDUCTOR INC9 citations83
US9225356B2Dec 29, 2015
Programming a non-volatile memory (NVM) system having error correction code (ECC)
FREESCALE SEMICONDUCTOR INC6 citations73
US10109356B2Oct 23, 2018
Method and apparatus for stressing a non-volatile memory
FREESCALE SEMICONDUCTOR INC2 citations71
US9240224B2Jan 19, 2016
Non-volatile memory (NVM) with variable verify operations
FREESCALE SEMICONDUCTOR INC2 citations62
US8363491B2Jan 29, 2013
Programming a non-volatile memory
FREESCALE SEMICONDUCTOR INC2 citations62
US7742340B2Jun 22, 2010
Read reference technique with current degradation protection
FREESCALE SEMICONDUCTOR INC5 citations59