Inventor
FU WEN-JUI
TW2 patents
Patents
2 patentsUS5807787ASep 15, 1998
Method for reducing surface leakage current on semiconductor intergrated circuits during polyimide passivation
TAIWAN SEMICONDUCTOR MFG40 citations89
US7067433B2Jun 27, 2006
Method to reduce the fluorine contamination on the Al/Al-Cu pad by a post high cathod temperature plasma treatment
TAIWAN SEMICONDUCTOR MFG3 citations56