Inventor
HSU WEI TE
TW11 patents
⚠️ This page may combine multiple inventors who share the name “HSU WEI TE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IND TECH RES INST
4 patentsUS8386969B2Feb 26, 2013
Method for designing overlay targets and method and system for measuring overlay error using the same
IND TECH RES INST5 citations72
US7864324B2Jan 4, 2011
Reflective scatterometer
IND TECH RES INST4 citations60
US7872741B2Jan 18, 2011
Method and apparatus for scatterfield microscopical measurement
IND TECH RES INST3 citations58
US10503487B2Dec 10, 2019
System and method for deploying and controlling mobile operating system on a platform
IND TECH RES INST0 citations35
KU YI SHA
3 patentsUS8699021B2Apr 15, 2014
System, method and computer readable medium for through silicon via structure measurement
KU YI SHA5 citations70
US8321821B2Nov 27, 2012
Method for designing two-dimensional array overlay targets and method and system for measuring overlay errors using the same
KU YI SHA4 citations59
US8139233B2Mar 20, 2012
System and method for via structure measurement
KU YI SHA2 citations59
EMINENT ELECTRONIC TECH CORP LTD
2 patentsUS9569011B2Feb 14, 2017
Optical sensor module utilizing optical designs to adjust gesture sensitive region, and related mobile apparatus
EMINENT ELECTRONIC TECH CORP LTD1 citations50
US9778756B2Oct 3, 2017
Optical sensor module utilizing optical designs to adjust gesture sensitive region, and related mobile apparatus
EMINENT ELECTRONIC TECH CORP LTD0 citations39