Inventor
SUGAHARA HITOSHI
JP10 patents
⚠️ This page may combine multiple inventors who share the name “SUGAHARA HITOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
8 patentsUS10558127B2Feb 11, 2020
Exposure condition evaluation device
HITACHI HIGH TECH CORP4 citations71
US9990708B2Jun 5, 2018
Pattern-measuring apparatus and semiconductor-measuring system
HITACHI HIGH TECH CORP3 citations71
US11836906B2Dec 5, 2023
Image processing system and computer program for performing image processing
HITACHI HIGH TECH CORP0 citations62
US11176405B2Nov 16, 2021
Image processing system and computer program for performing image processing
HITACHI HIGH TECH CORP1 citations62
US10445875B2Oct 15, 2019
Pattern-measuring apparatus and semiconductor-measuring system
HITACHI HIGH TECH CORP1 citations60
US11443917B2Sep 13, 2022
Image generation method, non-transitory computer-readable medium, and system
HITACHI HIGH TECH CORP0 citations42
US10937628B2Mar 2, 2021
Charged particle beam device
HITACHI HIGH TECH CORP0 citations42
US10190875B2Jan 29, 2019
Pattern measurement condition setting device and pattern measuring device
HITACHI HIGH TECH CORP0 citations39