P

Inventor

TENG CLARENCE W

US33 patents

Patents

33 patents
US5043778AAug 27, 1991

Oxide-isolated source/drain transistor

TEXAS INSTRUMENTS INC76 citations96
US4987093AJan 22, 1991

Through-field implant isolated devices and method

TEXAS INSTRUMENTS INC59 citations96
US4963502AOct 16, 1990

Method of making oxide-isolated source/drain transistor

TEXAS INSTRUMENTS INC101 citations96
US4892614AJan 9, 1990

Integrated circuit isolation process

TEXAS INSTRUMENTS INC69 citations96
US4830978AMay 16, 1989

Dram cell and method

TEXAS INSTRUMENTS INC65 citations96
US4656732AApr 14, 1987

Integrated circuit fabrication process

TEXAS INSTRUMENTS INC78 citations96
US4631803ADec 30, 1986

Method of fabricating defect free trench isolation devices

TEXAS INSTRUMENTS INC124 citations96
US4864375ASep 5, 1989

Dram cell and method

TEXAS INSTRUMENTS INC68 citations93
US4842675AJun 27, 1989

Integrated circuit isolation process

TEXAS INSTRUMENTS INC45 citations93
US5894145AApr 13, 1999

Multiple substrate bias random access memory device

TEXAS INSTRUMENTS INC23 citations92
US5671175ASep 23, 1997

Capacitor over bitline DRAM cell

TEXAS INSTRUMENTS INC21 citations92
US5587614ADec 24, 1996

Microplanarization of rough electrodes by thin amorphous layers

TEXAS INSTRUMENTS INC21 citations92
US5352913AOct 4, 1994

Dynamic memory storage capacitor having reduced gated diode leakage

TEXAS INSTRUMENTS INC20 citations92
US5225363AJul 6, 1993

Trench capacitor DRAM cell and method of manufacture

TEXAS INSTRUMENTS INC29 citations92
US5156992AOct 20, 1992

Process for forming poly-sheet pillar transistor DRAM cell

TEXAS INSTRUMENTS INC23 citations92
US5087591AFeb 11, 1992

Contact etch process

TEXAS INSTRUMENTS INC47 citations92
US4983226AJan 8, 1991

Defect free trench isolation devices and method of fabrication

TEXAS INSTRUMENTS INC24 citations92
US4580330AApr 8, 1986

Integrated circuit isolation

TEXAS INSTRUMENTS INC44 citations92
US4561172ADec 31, 1985

Integrated circuit fabrication method utilizing selective etching and oxidation to form isolation regions

TEXAS INSTRUMENTS INC34 citations92
US5202279AApr 13, 1993

Poly sidewall process to reduce gated diode leakage

TEXAS INSTRUMENTS INC16 citations82
US4916524AApr 10, 1990

Dram cell and method

TEXAS INSTRUMENTS INC20 citations82
US5595925AJan 21, 1997

Method for fabricating a multiple well structure for providing multiple substrate bias for DRAM device formed therein

TEXAS INSTRUMENTS INC11 citations74
US5105245AApr 14, 1992

Trench capacitor DRAM cell with diffused bit lines adjacent to a trench

TEXAS INSTRUMENTS INC16 citations74
US5061653AOct 29, 1991

Trench isolation process

TEXAS INSTRUMENTS INC16 citations74
US5028980AJul 2, 1991

Trench capacitor with expanded area

TEXAS INSTRUMENTS INC12 citations74
US4947227AAug 7, 1990

Latch-up resistant CMOS structure

TEXAS INSTRUMENTS INC14 citations74
US4890147ADec 26, 1989

Through-field implant isolated devices and method

TEXAS INSTRUMENTS INC14 citations74
US4660278AApr 28, 1987

Process of making IC isolation structure

TEXAS INSTRUMENTS INC15 citations74
US5364812ANov 15, 1994

High density dynamic RAM cell

TEXAS INSTRUMENTS INC7 citations72
US5057887AOct 15, 1991

High density dynamic ram cell

TEXAS INSTRUMENTS INC9 citations72
US4958206ASep 18, 1990

Diffused bit line trench capacitor dram cell

TEXAS INSTRUMENTS INC9 citations72
US5049519ASep 17, 1991

Latch-up resistant CMOS process

TEXAS INSTRUMENTS INC4 citations63
US4958212ASep 18, 1990

Trench memory cell

TEXAS INSTRUMENTS INC4 citations60