Inventor
DE JONG ALAN F
NL4 patents
Patents
4 patentsUS5221844AJun 22, 1993
Charged particle beam device
PHILIPS CORP71 citations94
US5986270ANov 16, 1999
Particle-optical apparatus including a low-temperature specimen holder
PHILIPS CORP71 citations92
US5448063ASep 5, 1995
Energy filter with correction of a second-order chromatic aberration
PHILIPS CORP35 citations90
US5233192AAug 3, 1993
Method for autotuning of an electron microscope, and an electron microscope suitable for carrying out such a method
PHILIPS CORP5 citations57