Inventor
IKKU YUTAKA
JP18 patents
⚠️ This page may combine multiple inventors who share the name “IKKU YUTAKA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SII NANOTECHNOLOGY INC
12 patentsUS7627088B2Dec 1, 2009
X-ray tube and X-ray analysis apparatus
SII NANOTECHNOLOGY INC20 citations92
US7442942B2Oct 28, 2008
Charged particle beam apparatus
SII NANOTECHNOLOGY INC20 citations92
US7436926B2Oct 14, 2008
Fluorescent X-ray analysis apparatus
SII NANOTECHNOLOGY INC19 citations92
US7973280B2Jul 5, 2011
Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the same
SII NANOTECHNOLOGY INC7 citations84
US7634054B2Dec 15, 2009
X-ray tube and X-ray analysis apparatus
SII NANOTECHNOLOGY INC12 citations84
US7054506B2May 30, 2006
Pattern measuring method and measuring system using display microscope image
SII NANOTECHNOLOGY INC13 citations83
US7423266B2Sep 9, 2008
Sample height regulating method, sample observing method, sample processing method and charged particle beam apparatus
SII NANOTECHNOLOGY INC7 citations73
US7518109B2Apr 14, 2009
Method and apparatus of measuring thin film sample and method and apparatus of fabricating thin film sample
SII NANOTECHNOLOGY INC3 citations63
US7595488B2Sep 29, 2009
Method and apparatus for specifying working position on a sample and method of working the sample
SII NANOTECHNOLOGY INC2 citations62
US7531796B2May 12, 2009
Focused ion beam apparatus and sample section forming and thin-piece sample preparing methods
SII NANOTECHNOLOGY INC3 citations62
US7002150B2Feb 21, 2006
Thin specimen producing method and apparatus
SII NANOTECHNOLOGY INC6 citations62
US6924481B2Aug 2, 2005
Scanning microscope with brightness control
SII NANOTECHNOLOGY INC3 citations59