Inventor
CHOUAIB HOUSSAM
US18 patents
⚠️ This page may combine multiple inventors who share the name “CHOUAIB HOUSSAM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA CORP
9 patentsUS11573077B2Feb 7, 2023
Scatterometry based methods and systems for measurement of strain in semiconductor structures
KLA CORP4 citations73
US11099137B2Aug 24, 2021
Visualization of three-dimensional semiconductor structures
KLA CORP3 citations69
US11060846B2Jul 13, 2021
Scatterometry based methods and systems for measurement of strain in semiconductor structures
KLA CORP0 citations61
US11796390B2Oct 24, 2023
Bandgap measurements of patterned film stacks using spectroscopic metrology
KLA CORP0 citations59
US12510590B2Dec 30, 2025
Metrology in the presence of CMOS under array (CuA) structures utilizing an effective medium model with physical modeling
KLA CORP0 citations48
US12380367B2Aug 5, 2025
Metrology in the presence of CMOS under array (CuA) structures utilizing machine learning and physical modeling
KLA CORP0 citations48
US12372882B2Jul 29, 2025
Metrology in the presence of CMOS under array (CUA) structures utilizing an effective medium model with classification of CUA structures
KLA CORP0 citations48
US12480893B2Nov 25, 2025
Optical and X-ray metrology methods for patterned semiconductor structures with randomness
KLA CORP0 citations43
US12379672B2Aug 5, 2025
Metrology of nanosheet surface roughness and profile
KLA CORP0 citations42
KLA TENCOR CORP
8 patentsUS11036898B2Jun 15, 2021
Measurement models of nanowire semiconductor structures based on re-useable sub-structures
KLA TENCOR CORP13 citations85
US7659979B2Feb 9, 2010
Optical inspection apparatus and method
KLA TENCOR CORP18 citations78
US11555689B2Jan 17, 2023
Measuring thin films on grating and bandgap on grating
KLA TENCOR CORP4 citations74
US10458912B2Oct 29, 2019
Model based optical measurements of semiconductor structures with anisotropic dielectric permittivity
KLA TENCOR CORP6 citations73
US11378451B2Jul 5, 2022
Bandgap measurements of patterned film stacks using spectroscopic metrology
KLA TENCOR CORP3 citations70
US11156548B2Oct 26, 2021
Measurement methodology of advanced nanostructures
KLA TENCOR CORP6 citations69
US10794839B2Oct 6, 2020
Visualization of three-dimensional semiconductor structures
KLA TENCOR CORP4 citations69
US10663286B2May 26, 2020
Measuring thin films on grating and bandgap on grating
KLA TENCOR CORP0 citations51