P

Inventor

YANG SEUNGHUNE

KR11 patents

Patents

11 patents
US9672611B2Jun 6, 2017

Pattern analysis method of a semiconductor device

SAMSUNG ELECTRONICS CO LTD2 citations65
US12237265B2Feb 25, 2025

Methods of manufacturing semiconductor devices

SAMSUNG ELECTRONICS CO LTD0 citations60
US11688687B2Jun 27, 2023

Semiconductor devices having landing pad patterns and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD0 citations60
US11900043B2Feb 13, 2024

Electronic device for manufacturing semiconductor device and operating method of electronic device

SAMSUNG ELECTRONICS CO LTD1 citations56
US11506983B2Nov 22, 2022

Method of designing mask layout based on error pattern and method of manufacturing mask

SAMSUNG ELECTRONICS CO LTD0 citations56
US12326711B2Jun 10, 2025

Method and computing device for manufacturing semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations50
US9476840B2Oct 25, 2016

Methods of inspecting a semiconductor device and semiconductor inspection systems

SAMSUNG ELECTRONICS CO LTD0 citations47
US12086526B2Sep 10, 2024

Methods and devices of correcting layout for semiconductor processes using machine learning

SAMSUNG ELECTRONICS CO LTD0 citations44
US12476073B2Nov 18, 2025

Scanning electron microscope image-based pitch walk inspection method and method of manufacturing semiconductor device comprising the inspection method

SAMSUNG ELECTRONICS CO LTD0 citations43
US12044961B2Jul 23, 2024

Method of forming mask including curvilinear shape and method of forming semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations41
US9965851B2May 8, 2018

Method for inspecting pattern and an apparatus for manufacturing a semiconductor device using the same

SAMSUNG ELECTRONICS CO LTD0 citations33