Inventor · disambiguated record
Osamu Kitade
Also filed as: KITADE OSAMU
10 granted patents·1 pending application·141 citations·filing 1995–2002
90Inventor score
Files withMITSUBISHI ELECTRIC CORP11
Top patents by PatentIndex Score
11 records- 0170US6285222B1Power-on reset circuit, and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Sep 4, 2001·26 cites·5 claims
- 0267US6314035B1Semiconductor memory device capable of manifesting a short-circuit failure associated with column select lineMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Nov 6, 2001·17 cites·9 claims
- 0365US6298000B1Dynamic type semiconductor memory device operable in self refresh operation mode and self refresh method thereofMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Oct 2, 2001·25 cites·23 claims
- 0463US6327208B1Semiconductor memory device having self refresh modeMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Dec 4, 2001·14 cites·4 claims
- 0560US6417726B1Semiconductor device capable of adjusting an internal power supply potential in a wide rangeMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jul 9, 2002·12 cites·10 claims
- 0652US6434070B1Semiconductor integrated circuit with variable bit line precharging voltageMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Aug 13, 2002·8 cites·11 claims
- 0751US6340823B1Semiconductor wafer having a multi-test circuit, and method for manufacturing a semiconductor device including multi-test processMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jan 22, 2002·17 cites·6 claims
- 0843US6225836B1Semiconductor integrated circuit device capable of altering an operating mode by an electrical input applied from outside product packageMITSUBISHI ELECTRIC CORP·Filed 1999·Granted May 1, 2001·9 cites·9 claims
- 0942US5694074ASemiconductor integrated circuit being able to generate sufficient boost potential disregarding generation of noiseMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Dec 2, 1997·8 cites·4 claims
- 1034US6414888B2Semiconductor storage device having burn-in modeMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jul 2, 2002·5 cites·11 claims
- 1130US2003090274A1Laser-trimming fuse detecting circuit and method for semiconductor integrated circuitMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
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