Inventor
DEBAUCHE JOHN
US3 patents
Patents
3 patentsUS9696347B2Jul 4, 2017
Testing apparatus and method for microcircuit and wafer level IC testing
JOHNSTECH INT CORP2 citations66
US10928423B2Feb 23, 2021
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings
JOHNSTECH INT CORP0 citations56
US10067164B2Sep 4, 2018
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings
JOHNSTECH INT CORP0 citations45