Inventor
SON JONGPIL
KR17 patents
⚠️ This page may combine multiple inventors who share the name “SON JONGPIL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
16 patentsUS10019367B2Jul 10, 2018
Memory module, computing system having the same, and method for testing tag error thereof
SAMSUNG ELECTRONICS CO LTD7 citations83
US11087821B2Aug 10, 2021
Memory module including register clock driver detecting address frequently accessed
SAMSUNG ELECTRONICS CO LTD12 citations82
US11295805B2Apr 5, 2022
Memory modules and stacked memory devices
SAMSUNG ELECTRONICS CO LTD4 citations71
US10854275B2Dec 1, 2020
Memory device and operation method thereof
SAMSUNG ELECTRONICS CO LTD2 citations71
US10032523B2Jul 24, 2018
Memory device including extra capacity and stacked memory device including the same
SAMSUNG ELECTRONICS CO LTD3 citations66
US12531128B2Jan 20, 2026
Memory device, memory system having the same and operating method thereof
SAMSUNG ELECTRONICS CO LTD0 citations61
US12494244B2Dec 9, 2025
Memory device and refresh method thereof
SAMSUNG ELECTRONICS CO LTD0 citations61
US12315549B2May 27, 2025
Semiconductor memory device for performing remaining bank refresh operation and refresh method thereof
SAMSUNG ELECTRONICS CO LTD0 citations61
US11715542B2Aug 1, 2023
Semiconductor device including defect detection circuit and method of detecting defects in the same
SAMSUNG ELECTRONICS CO LTD0 citations61
US11417408B2Aug 16, 2022
Semiconductor device including defect detection circuit and method of detecting defects in the same
SAMSUNG ELECTRONICS CO LTD1 citations61
US10868021B2Dec 15, 2020
Semiconductor memory devices
SAMSUNG ELECTRONICS CO LTD1 citations61
US10361212B2Jul 23, 2019
Semiconductor memory devices
SAMSUNG ELECTRONICS CO LTD1 citations61
US10332231B2Jun 25, 2019
Computing system and method of performing tile-based rendering of graphics pipeline
SAMSUNG ELECTRONICS CO LTD1 citations61
US11567692B2Jan 31, 2023
Memory device including interface circuit for data conversion according to different endian formats
SAMSUNG ELECTRONICS CO LTD0 citations51
US12417813B2Sep 16, 2025
Memory device for outputting test results
SAMSUNG ELECTRONICS CO LTD0 citations50
US10228876B2Mar 12, 2019
Memory apparatus including multiple buffers and method of driving memory including multiple buffers
SAMSUNG ELECTRONICS CO LTD0 citations47