Inventor
ONISHI TAKAKO
JP11 patents
⚠️ This page may combine multiple inventors who share the name “ONISHI TAKAKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
OMRON TATEISI ELECTRONICS CO
7 patentsUS7822261B2Oct 26, 2010
Board inspecting apparatus, its parameter setting method and parameter setting apparatus
OMRON TATEISI ELECTRONICS CO7 citations73
US10054432B2Aug 21, 2018
X-ray inspection apparatus and control method
OMRON TATEISI ELECTRONICS CO6 citations71
US7715616B2May 11, 2010
PC board inspecting method and apparatus and inspection logic setting method and apparatus
OMRON TATEISI ELECTRONICS CO4 citations62
US11154001B2Oct 19, 2021
Inspection management system, inspection management apparatuses, and inspection management method
OMRON TATEISI ELECTRONICS CO0 citations50
US10876977B2Dec 29, 2020
Inspection management system, inspection management apparatuses, and inspection management method
OMRON TATEISI ELECTRONICS CO0 citations40
US10605748B2Mar 31, 2020
X-ray inspection apparatus and X-ray inspection method
OMRON TATEISI ELECTRONICS CO0 citations40
US10545101B2Jan 28, 2020
Inspection apparatus
OMRON TATEISI ELECTRONICS CO0 citations37