Inventor · disambiguated record
Wo-Hsing Chen
Also filed as: CHEN WO-HSING
5 granted patents·8 pending applications·249 citations·filing 2005–2016
82Inventor score
Files withFOCUS SURGERY INC4SANGHVI NARENDRA T4SEIP RALF3ALBERT EINSTEIN COLLEGE MEDICINE INC1CHEN WO-HSING1
Top patents by PatentIndex Score
13 records- 0196US7662114B2Ultrasound phased arraysFOCUS SURGERY INC·Filed 2005·Granted Feb 16, 2010·184 cites·13 claims
- 0285US8038631B1Laparoscopic HIFU probeSANGHVI NARENDRA T·Filed 2009·Granted Oct 18, 2011·47 cites·10 claims
- 0374US9457202B2Method of diagnosis and treatment of tumors using high intensity focused ultrasoundSANGHVI NARENDRA T·Filed 2014·Granted Oct 4, 2016·7 cites·38 claims
- 0465US8235902B2System and method for tissue change monitoring during HIFU treatmentCHEN WO-HSING·Filed 2007·Granted Aug 7, 2012·11 cites·18 claims
- 0557US9907982B2Method of diagnosis and treatment of tumors using high intensity focused ultrasoundALBERT EINSTEIN COLLEGE MEDICINE INC·Filed 2016·Granted Mar 6, 2018·0 cites·11 claims
- 0651US2010092424A1Method of diagnosis and treatment of tumors using high intensity focused ultrasoundSANGHVI NARENDRA T·Filed 2008·Application pending·0 cites
- 0750US2013018260A1Method of diagnosis and treatment of tumors using high intensity focused ultrasoundFOCUS SURGERY INC·Filed 2012·Application pending·0 cites
- 0846US2010022921A1Ultrasound phased arraysSEIP RALF·Filed 2009·Application pending·0 cites
- 0945US2007219448A1Method and Apparatus for Selective Treatment of TissueFOCUS SURGERY INC·Filed 2005·Application pending·0 cites
- 1043US2011201976A1Laparoscopic hifu probeFOCUS SURGERY INC·Filed 2011·Application pending·0 cites
- 1140US2008039724A1Ultrasound transducer with improved imagingSEIP RALF·Filed 2006·Application pending·0 cites
- 1238US2012150035A1Method and Apparatus for the Selective Treatment of TissueSEIP RALF·Filed 2012·Application pending·0 cites
- 1337US2012035473A1Laparoscopic hifu probeSANGHVI NARENDRA T·Filed 2010·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →