P

Inventor

LOUBET NICOLAS

US223 patents
⚠️ This page may combine multiple inventors who share the name “LOUBET NICOLAS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ST MICROELECTRONICS INC

23 patents
US8956942B2Feb 17, 2015

Method of forming a fully substrate-isolated FinFET transistor

ST MICROELECTRONICS INC41 citations98
US8975168B2Mar 10, 2015

Method for the formation of fin structures for FinFET devices

ST MICROELECTRONICS INC23 citations93
US8952420B1Feb 10, 2015

Method to induce strain in 3-D microfabricated structures

ST MICROELECTRONICS INC19 citations93
US8759874B1Jun 24, 2014

FinFET device with isolated channel

ST MICROELECTRONICS INC31 citations93
US10515965B2Dec 24, 2019

Method to induce strain in finFET channels from an adjacent region

ST MICROELECTRONICS INC4 citations84
US10505043B2Dec 10, 2019

Semiconductor device with fin and related methods

ST MICROELECTRONICS INC3 citations84
US10483393B2Nov 19, 2019

Method to induce strain in 3-D microfabricated structures

ST MICROELECTRONICS INC4 citations84
US10177255B2Jan 8, 2019

Semiconductor device with fin and related methods

ST MICROELECTRONICS INC4 citations84
US10062690B2Aug 28, 2018

Multi-fin FINFET device including epitaxial growth barrier on outside surfaces of outermost fins and related methods

ST MICROELECTRONICS INC5 citations84
US10043805B2Aug 7, 2018

Method to induce strain in finFET channels from an adjacent region

ST MICROELECTRONICS INC4 citations84
US9806196B2Oct 31, 2017

Semiconductor device with fin and related methods

ST MICROELECTRONICS INC4 citations84
US9685380B2Jun 20, 2017

Method to co-integrate SiGe and Si channels for finFET devices

ST MICROELECTRONICS INC8 citations84
US9679899B2Jun 13, 2017

Co-integration of tensile silicon and compressive silicon germanium

ST MICROELECTRONICS INC5 citations84
US9620507B2Apr 11, 2017

Silicon-on-nothing transistor semiconductor structure with channel epitaxial silicon-germanium region

ST MICROELECTRONICS INC6 citations84
US9548361B1Jan 17, 2017

Method of using a sacrificial gate structure to make a metal gate FinFET transistor

ST MICROELECTRONICS INC6 citations84
US9520393B2Dec 13, 2016

Fully substrate-isolated FinFET transistor

ST MICROELECTRONICS INC9 citations84
US9466720B2Oct 11, 2016

Method of making a CMOS semiconductor device using a stressed silicon-on-insulator (SOI) wafer

ST MICROELECTRONICS INC5 citations84
US9466718B2Oct 11, 2016

Semiconductor device with fin and related methods

ST MICROELECTRONICS INC8 citations84
US9406783B2Aug 2, 2016

Method to induce strain in finFET channels from an adjacent region

ST MICROELECTRONICS INC5 citations84
US9245953B2Jan 26, 2016

Method to induce strain in 3-D microfabricated structures

ST MICROELECTRONICS INC6 citations84
US9166023B2Oct 20, 2015

Bulk finFET semiconductor-on-nothing integration

ST MICROELECTRONICS INC13 citations84
US9099559B2Aug 4, 2015

Method to induce strain in finFET channels from an adjacent region

ST MICROELECTRONICS INC6 citations84
US9018057B1Apr 28, 2015

Method of making a CMOS semiconductor device using a stressed silicon-on-insulator (SOI) wafer

ST MICROELECTRONICS INC10 citations84

IBM

13 patents
US10573755B1Feb 25, 2020

Nanosheet FET with box isolation on substrate

IBM32 citations94
US10424651B2Sep 24, 2019

Forming nanosheet transistor using sacrificial spacer and inner spacers

IBM16 citations94
US10367061B1Jul 30, 2019

Replacement metal gate and inner spacer formation in three dimensional structures using sacrificial silicon germanium

IBM23 citations94
US10998234B2May 4, 2021

Nanosheet bottom isolation and source or drain epitaxial growth

IBM11 citations86
US10903315B2Jan 26, 2021

Formation of dielectric layer as etch-stop for source and drain epitaxy disconnection

IBM12 citations86
US10748901B2Aug 18, 2020

Interlayer via contacts for monolithic three-dimensional semiconductor integrated circuit devices

IBM11 citations86
US10170520B1Jan 1, 2019

Negative-capacitance steep-switch field effect transistor with integrated bi-stable resistive system

IBM19 citations86
US10832964B1Nov 10, 2020

Replacement contact formation for gate contact over active region with selective metal growth

IBM8 citations84
US10546942B2Jan 28, 2020

Nanosheet transistor with optimized junction and cladding defectivity control

IBM7 citations84
US10388760B1Aug 20, 2019

Sub-thermal switching slope vertical field effect transistor with dual-gate feedback loop mechanism

IBM4 citations84
US10256316B1Apr 9, 2019

Steep-switch field effect transistor with integrated bi-stable resistive system

IBM7 citations84
US9219078B2Dec 22, 2015

Simplified multi-threshold voltage scheme for fully depleted SOI MOSFETs

IBM11 citations84
US9171757B2Oct 27, 2015

Dual shallow trench isolation liner for preventing electrical shorts

IBM8 citations84

GLOBALFOUNDRIES INC

7 patents

LIU QING

3 patents

BASKER VEERARAGHAVAN S

2 patents

COMMISSARIAT ENERGIE ATOMIQUE

1 patent

DORIS BRUCE B

1 patent

Showing the top 50 of 223 patents by PatentIndex Score.