P

Inventor

MORI CHIKAOMI

JP12 patents
⚠️ This page may combine multiple inventors who share the name “MORI CHIKAOMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

JAPAN ELECTRONIC MATERIALS

5 patents
US6967493B2Nov 22, 2005

Probe card and contactor of the same

JAPAN ELECTRONIC MATERIALS35 citations89
US7106080B2Sep 12, 2006

Probe card and contactor of the same

JAPAN ELECTRONIC MATERIALS6 citations70
US7081766B2Jul 25, 2006

Probe card for examining semiconductor devices on semiconductor wafers

JAPAN ELECTRONIC MATERIALS9 citations66
US10908180B2Feb 2, 2021

Probe card case and probe card transfer method

JAPAN ELECTRONIC MATERIALS0 citations61
US10184954B2Jan 22, 2019

Probe card case and probe card transfer method

JAPAN ELECTRONIC MATERIALS0 citations51

NIHON DENSHIZAIRYO KK

3 patents
US7075319B2Jul 11, 2006

Probe card having a coil spring interposed between a support member and a contactor unit

NIHON DENSHIZAIRYO KK29 citations91
US7307435B2Dec 11, 2007

Probe card

NIHON DENSHIZAIRYO KK10 citations82
US6836024B2Dec 28, 2004

Apparatus for connecting between substrates

NIHON DENSHIZAIRYO KK2 citations55

JAPAN ELECTRONIC MAT CORPORATION

2 patents
US12332278B2Jun 17, 2025

Probe card

JAPAN ELECTRONIC MAT CORPORATION0 citations50
US10139430B2Nov 27, 2018

Probe guide, probe card, and method for probe guide manufacturing

JAPAN ELECTRONIC MAT CORPORATION0 citations49

TOKYO ELECTRON LTD

1 patent
USD751555SMar 15, 2016

Probe card case

TOKYO ELECTRON LTD2 citations61

SHINKO ELECTRIC IND CO

1 patent
US10261110B2Apr 16, 2019

Probe guide plate having a silicon oxide layer formed on surfaces and on an inner wall of a through hole thereof, and a protective insulating layer formed on the silicon oxide layer, and probe apparatus including the probe guide plate

SHINKO ELECTRIC IND CO0 citations40