Inventor
LIU DING-I
TW46 patents
⚠️ This page may combine multiple inventors who share the name “LIU DING-I”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
38 patentsUS10533252B2Jan 14, 2020
Showerhead, semicondcutor processing apparatus having the same and semiconductor process
TAIWAN SEMICONDUCTOR MFG CO LTD10 citations82
US10161041B2Dec 25, 2018
Thermal chemical vapor deposition system and operating method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations79
US11315829B2Apr 26, 2022
Amorphous layers for reducing copper diffusion and method forming same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11264467B2Mar 1, 2022
Semiconductor device having multi-layer diffusion barrier and method of making the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US10749004B2Aug 18, 2020
Semiconductor device having a multi-layer diffusion barrier
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US10867787B2Dec 15, 2020
Method for controlling plasma in semiconductor fabrication
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations70
US10864530B2Dec 15, 2020
Coating apparatus and method of forming coating film
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations69
US9607873B2Mar 28, 2017
Apparatus and operation method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations69
US9573144B2Feb 21, 2017
Coating apparatus and method of forming coating film
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations69
US11194259B2Dec 7, 2021
Equipment module with enhanced protection from airborne contaminants, and method of operation
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations67
US12444647B2Oct 14, 2025
Electron migration control in interconnect structures
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12354907B2Jul 8, 2025
Electron migration control in interconnect structures
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11264273B2Mar 1, 2022
Electron migration control in interconnect structures
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12354908B2Jul 8, 2025
Amorphous layers for reducing copper diffusion and method forming same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12020905B2Jun 25, 2024
Method of using high density plasma chemical vapor deposition chamber
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11967522B2Apr 23, 2024
Amorphous layers for reducing copper diffusion and method forming same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11742393B2Aug 29, 2023
Semiconductor device having a multi-layer diffusion barrier and method of making the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11342164B2May 24, 2022
High density plasma chemical vapor deposition chamber and method of using
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US10910199B2Feb 2, 2021
Method of controlling an adjustable nozzle and method of making a semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12148656B2Nov 19, 2024
Method of manufacturing semiconductor device and semiconductor devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US11322397B2May 3, 2022
Method of manufacturing semiconductor devices including formation of adhesion enhancement layer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US12020947B2Jun 25, 2024
Method of manufacturing semiconductor devices and semiconductor devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations57
US11069534B2Jul 20, 2021
Method of manufacturing semiconductor devices and semiconductor devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations57
US10626499B2Apr 21, 2020
Deposition device structure
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations57
US10978337B2Apr 13, 2021
Aluminum-containing layers and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56
US9831307B2Nov 28, 2017
Gap fill self planarization on post EPI
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9536771B2Jan 3, 2017
Gap fill self planarization on post EPI
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9953861B2Apr 24, 2018
Semiconductor device having a shallow trench isolation structure and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US9209071B2Dec 8, 2015
Semiconductor structure with anti-etch structure in via and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US10395918B2Aug 27, 2019
Method and system for controlling plasma in semiconductor fabrication
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations49
US9324559B2Apr 26, 2016
Thin film deposition apparatus with multi chamber design and film deposition methods
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations48
US9048185B2Jun 2, 2015
Profile pre-shaping for replacement poly gate interlayer dielectric
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations48
US10867838B2Dec 15, 2020
Semiconductor device having a shallow trench isolation structure and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations47
US10724140B2Jul 28, 2020
Thermal chemical vapor deposition system and operating method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations47
US10164063B2Dec 25, 2018
Semiconductor structure with protection layer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations41
US9859113B2Jan 2, 2018
Structure and method of semiconductor device structure with gate
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations35
US9607809B2Mar 28, 2017
High density plasma reactor with multiple top coils
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations32
US9859137B2Jan 2, 2018
Substrate heat treatment apparatus and heat treatment method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations30