P

Inventor

LIU DING-I

TW46 patents
⚠️ This page may combine multiple inventors who share the name “LIU DING-I”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

38 patents
US10533252B2Jan 14, 2020

Showerhead, semicondcutor processing apparatus having the same and semiconductor process

TAIWAN SEMICONDUCTOR MFG CO LTD10 citations82
US10161041B2Dec 25, 2018

Thermal chemical vapor deposition system and operating method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations79
US11315829B2Apr 26, 2022

Amorphous layers for reducing copper diffusion and method forming same

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11264467B2Mar 1, 2022

Semiconductor device having multi-layer diffusion barrier and method of making the same

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US10749004B2Aug 18, 2020

Semiconductor device having a multi-layer diffusion barrier

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US10867787B2Dec 15, 2020

Method for controlling plasma in semiconductor fabrication

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations70
US10864530B2Dec 15, 2020

Coating apparatus and method of forming coating film

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations69
US9607873B2Mar 28, 2017

Apparatus and operation method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD6 citations69
US9573144B2Feb 21, 2017

Coating apparatus and method of forming coating film

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations69
US11194259B2Dec 7, 2021

Equipment module with enhanced protection from airborne contaminants, and method of operation

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations67
US12444647B2Oct 14, 2025

Electron migration control in interconnect structures

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12354907B2Jul 8, 2025

Electron migration control in interconnect structures

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11264273B2Mar 1, 2022

Electron migration control in interconnect structures

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12354908B2Jul 8, 2025

Amorphous layers for reducing copper diffusion and method forming same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12020905B2Jun 25, 2024

Method of using high density plasma chemical vapor deposition chamber

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11967522B2Apr 23, 2024

Amorphous layers for reducing copper diffusion and method forming same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11742393B2Aug 29, 2023

Semiconductor device having a multi-layer diffusion barrier and method of making the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11342164B2May 24, 2022

High density plasma chemical vapor deposition chamber and method of using

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US10910199B2Feb 2, 2021

Method of controlling an adjustable nozzle and method of making a semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12148656B2Nov 19, 2024

Method of manufacturing semiconductor device and semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US11322397B2May 3, 2022

Method of manufacturing semiconductor devices including formation of adhesion enhancement layer

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US12020947B2Jun 25, 2024

Method of manufacturing semiconductor devices and semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations57
US11069534B2Jul 20, 2021

Method of manufacturing semiconductor devices and semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations57
US10626499B2Apr 21, 2020

Deposition device structure

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations57
US10978337B2Apr 13, 2021

Aluminum-containing layers and methods of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56
US9831307B2Nov 28, 2017

Gap fill self planarization on post EPI

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9536771B2Jan 3, 2017

Gap fill self planarization on post EPI

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9953861B2Apr 24, 2018

Semiconductor device having a shallow trench isolation structure and methods of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US9209071B2Dec 8, 2015

Semiconductor structure with anti-etch structure in via and method for manufacturing the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US10395918B2Aug 27, 2019

Method and system for controlling plasma in semiconductor fabrication

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations49
US9324559B2Apr 26, 2016

Thin film deposition apparatus with multi chamber design and film deposition methods

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations48
US9048185B2Jun 2, 2015

Profile pre-shaping for replacement poly gate interlayer dielectric

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations48
US10867838B2Dec 15, 2020

Semiconductor device having a shallow trench isolation structure and methods of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations47
US10724140B2Jul 28, 2020

Thermal chemical vapor deposition system and operating method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations47
US10164063B2Dec 25, 2018

Semiconductor structure with protection layer

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations41
US9859113B2Jan 2, 2018

Structure and method of semiconductor device structure with gate

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations35
US9607809B2Mar 28, 2017

High density plasma reactor with multiple top coils

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations32
US9859137B2Jan 2, 2018

Substrate heat treatment apparatus and heat treatment method

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations30

WANG LAN-HAI

2 patents

TAIWAN SEMICONDUCTOR MFG

2 patents

CHANG JEN-CHI

1 patent

WU WEI CHING

1 patent

LI YI-FANG

1 patent

CHIANG CHIH-WEI

1 patent