Inventor
HAN LIQUN
US18 patents
⚠️ This page may combine multiple inventors who share the name “HAN LIQUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR CORP
6 patentsUS8362425B2Jan 29, 2013
Multiple-beam system for high-speed electron-beam inspection
KLA TENCOR CORP68 citations97
US7821187B1Oct 26, 2010
Immersion gun equipped electron beam column
KLA TENCOR CORP38 citations92
US6774646B1Aug 10, 2004
Electron beam inspection system using multiple electron beams and uniform focus and deflection mechanisms
KLA TENCOR CORP28 citations92
US9443696B2Sep 13, 2016
Electron beam imaging with dual Wien-filter monochromator
KLA TENCOR CORP9 citations84
US7919193B1Apr 5, 2011
Shielding, particulate reducing high vacuum components
KLA TENCOR CORP2 citations62
US8921782B2Dec 30, 2014
Tilt-imaging scanning electron microscope
KLA TENCOR CORP2 citations60
CEPTON TECHNOLOGIES INC
4 patentsUS10690754B2Jun 23, 2020
Scanning apparatuses and methods for a lidar system
CEPTON TECHNOLOGIES INC15 citations93
US10955530B2Mar 23, 2021
Systems for vibration cancellation in a lidar system
CEPTON TECHNOLOGIES INC6 citations83
US10754036B2Aug 25, 2020
Scanning illuminated three-dimensional imaging systems
CEPTON TECHNOLOGIES INC1 citations72
US11592527B2Feb 28, 2023
Systems for incorporating LiDAR sensors in a headlamp module of a vehicle
CEPTON TECHNOLOGIES INC0 citations51
JIANG XINRONG
3 patentsUS8664594B1Mar 4, 2014
Electron-optical system for high-speed and high-sensitivity inspections
JIANG XINRONG120 citations96
US8859982B2Oct 14, 2014
Dual-lens-gun electron beam apparatus and methods for high-resolution imaging with both high and low beam currents
JIANG XINRONG6 citations72
US9053900B2Jun 9, 2015
Apparatus and methods for high-resolution electron beam imaging
JIANG XINRONG3 citations61