Inventor

HOLVE DONALD J

US4 patents

⚠️ This page may combine multiple inventors who share the name “HOLVE DONALD J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INSITEC INC

1 patent

US5943130AAug 24, 1999

In situ sensor for near wafer particle monitoring in semiconductor device manufacturing equipment

INSITEC INC70 citations90

UNIV ARIZONA

1 patent

US5101113AMar 31, 1992

Ensemble scattering particle sizing system with axial spatial resolution

UNIV ARIZONA52 citations89

INSITEC MEASUREMENT SYSTEMS

1 patent

US5619324AApr 8, 1997

Method for measuring particle size in the presence of multiple scattering

INSITEC MEASUREMENT SYSTEMS40 citations84

INFICON INC

1 patent

US6906799B2Jun 14, 2005

Signal processing method for in-situ, scanned-beam particle monitoring

INFICON INC6 citations54