Inventor
SUGAMORI SHIGERU
US24 patents
⚠️ This page may combine multiple inventors who share the name “SUGAMORI SHIGERU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANTEST CORP
20 patentsUS6331770B1Dec 18, 2001
Application specific event based semiconductor test system
ADVANTEST CORP90 citations98
US6678643B1Jan 13, 2004
Event based semiconductor test system
ADVANTEST CORP55 citations96
US6651204B1Nov 18, 2003
Modular architecture for memory testing on event based test system
ADVANTEST CORP64 citations96
US6629282B1Sep 30, 2003
Module based flexible semiconductor test system
ADVANTEST CORP59 citations96
US6536006B1Mar 18, 2003
Event tester architecture for mixed signal testing
ADVANTEST CORP58 citations96
US6532561B1Mar 11, 2003
Event based semiconductor test system
ADVANTEST CORP62 citations96
US6631340B2Oct 7, 2003
Application specific event based semiconductor memory test system
ADVANTEST CORP27 citations92
US6567941B1May 20, 2003
Event based test system storing pin calibration data in non-volatile memory
ADVANTEST CORP43 citations92
US6404218B1Jun 11, 2002
Multiple end of test signal for event based test system
ADVANTEST CORP24 citations92
US6377065B1Apr 23, 2002
Glitch detection for semiconductor test system
ADVANTEST CORP50 citations92
US6314034B1Nov 6, 2001
Application specific event based semiconductor memory test system
ADVANTEST CORP41 citations92
US6578169B1Jun 10, 2003
Data failure memory compaction for semiconductor test system
ADVANTEST CORP19 citations84
US6185708B1Feb 6, 2001
Maintenance free test system
ADVANTEST CORP19 citations84
US7089135B2Aug 8, 2006
Event based IC test system
ADVANTEST CORP15 citations82
US6545460B2Apr 8, 2003
Power source current measurement unit for semiconductor test system
ADVANTEST CORP8 citations74
US6445208B1Sep 3, 2002
Power source current measurement unit for semiconductor test system
ADVANTEST CORP9 citations74
US6172544B1Jan 9, 2001
Timing signal generation circuit for semiconductor test system
ADVANTEST CORP9 citations74
US7209849B1Apr 24, 2007
Test system, added apparatus, and test method
ADVANTEST CORP7 citations72
US6668331B1Dec 23, 2003
Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory
ADVANTEST CORP11 citations69
US7596730B2Sep 29, 2009
Test method, test system and assist board
ADVANTEST CORP4 citations61