Inventor
ITAGAKI YOUSUKE
JP14 patents
⚠️ This page may combine multiple inventors who share the name “ITAGAKI YOUSUKE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FAB SOLUTIONS INC
11 patentsUS6768324B1Jul 27, 2004
Semiconductor device tester which measures information related to a structure of a sample in a depth direction
FAB SOLUTIONS INC141 citations98
US6559662B1May 6, 2003
Semiconductor device tester and semiconductor device test method
FAB SOLUTIONS INC59 citations96
US7321805B2Jan 22, 2008
Production managing system of semiconductor device
FAB SOLUTIONS INC14 citations92
US6975125B2Dec 13, 2005
Semiconductor device tester
FAB SOLUTIONS INC19 citations92
US6946857B2Sep 20, 2005
Semiconductor device tester
FAB SOLUTIONS INC25 citations92
US6850079B2Feb 1, 2005
Film thickness measuring apparatus and a method for measuring a thickness of a film
FAB SOLUTIONS INC16 citations92
US6614244B2Sep 2, 2003
Semiconductor device inspecting apparatus
FAB SOLUTIONS INC35 citations92
US6842663B2Jan 11, 2005
Production managing system of semiconductor device
FAB SOLUTIONS INC5 citations73
US6711453B2Mar 23, 2004
Production managing system of semiconductor device
FAB SOLUTIONS INC10 citations73
US7002361B2Feb 21, 2006
Film thickness measuring apparatus and a method for measuring a thickness of a film
FAB SOLUTIONS INC2 citations62
US6837936B2Jan 4, 2005
Semiconductor manufacturing device
FAB SOLUTIONS INC2 citations62