Inventor

IN SUNG-HWAN

KR2 patents

Patents

2 patents

US6888366B2May 3, 2005

Apparatus and method for testing a plurality of semiconductor chips

SAMSUNG ELECTRONICS CO LTD25 citations89

US6990617B2Jan 24, 2006

Semiconductor memory device and test method of the same

SAMSUNG ELECTRONICS CO LTD4 citations57