Inventor
HAPKE FRIEDRICH
DE18 patents
⚠️ This page may combine multiple inventors who share the name “HAPKE FRIEDRICH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KONINKL PHILIPS ELECTRONICS NV
6 patentsUS6789221B2Sep 7, 2004
Integrated circuit with self-test circuit
KONINKL PHILIPS ELECTRONICS NV14 citations83
US6789219B2Sep 7, 2004
Arrangement and method of testing an integrated circuit
KONINKL PHILIPS ELECTRONICS NV7 citations69
US7143322B2Nov 28, 2006
Arrangement and method of testing an integrated circuit
KONINKL PHILIPS ELECTRONICS NV2 citations62
US7139953B2Nov 21, 2006
Integrated circuit with test circuit
KONINKL PHILIPS ELECTRONICS NV2 citations62
US7039844B2May 2, 2006
Integrated circuit with self-testing circuit
KONINKL PHILIPS ELECTRONICS NV4 citations62
US6768292B2Jul 27, 2004
Arrangement and method having a data word generator for testing integrated circuits
KONINKL PHILIPS ELECTRONICS NV2 citations62
HAPKE FRIEDRICH
6 patentsUS8250420B2Aug 21, 2012
Testable integrated circuit and test data generation method
HAPKE FRIEDRICH7 citations79
US8103925B2Jan 24, 2012
On-chip logic to support compressed X-masking for BIST
HAPKE FRIEDRICH6 citations69
US8112686B2Feb 7, 2012
Deterministic logic built-in self-test stimuli generation
HAPKE FRIEDRICH5 citations59
US8423845B2Apr 16, 2013
On-chip logic to log failures during production testing and enable debugging for failure diagnosis
HAPKE FRIEDRICH3 citations57
US8990760B2Mar 24, 2015
Cell-aware fault model generation for delay faults
HAPKE FRIEDRICH2 citations54
US8448008B2May 21, 2013
High speed clock control
HAPKE FRIEDRICH1 citations44
PHILIPS CORP
3 patentsUS4339710AJul 13, 1982
MOS Integrated test circuit using field effect transistors
PHILIPS CORP50 citations92
US4336495AJun 22, 1982
Integrated circuit arrangement in MOS-technology with field-effect transistors
PHILIPS CORP50 citations92
US4398146AAug 9, 1983
Test circuit for MOS devices
PHILIPS CORP45 citations86