Inventor
SCHLOEFFEL JUERGEN
DE3 patents
Patents
3 patentsUS8250420B2Aug 21, 2012
Testable integrated circuit and test data generation method
HAPKE FRIEDRICH7 citations79
US8423845B2Apr 16, 2013
On-chip logic to log failures during production testing and enable debugging for failure diagnosis
HAPKE FRIEDRICH3 citations57
US8990760B2Mar 24, 2015
Cell-aware fault model generation for delay faults
HAPKE FRIEDRICH2 citations54