Inventor

GLOWATZ ANDREAS

DE5 patents

⚠️ This page may combine multiple inventors who share the name “GLOWATZ ANDREAS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NXP BV

1 patent

US7376873B2May 20, 2008

Method and system for selectively masking test responses

NXP BV16 citations80

MENTOR GRAPHICS CORP

1 patent

US11635462B2Apr 25, 2023

Library cell modeling for transistor-level test pattern generation

MENTOR GRAPHICS CORP2 citations72

KONINKL PHILIPS ELECTRONICS NV

1 patent

US6789219B2Sep 7, 2004

Arrangement and method of testing an integrated circuit

KONINKL PHILIPS ELECTRONICS NV7 citations69

HAPKE FRIEDRICH

1 patent

US8990760B2Mar 24, 2015

Cell-aware fault model generation for delay faults

HAPKE FRIEDRICH2 citations54

KRENZ-BAATH RENE

1 patent

US8689069B2Apr 1, 2014

Multi-targeting boolean satisfiability-based test pattern generation

KRENZ-BAATH RENE3 citations52