Inventor
ISHIOKA SHOGO
JP18 patents
Patents
18 patentsUS7173445B2Feb 6, 2007
Sensor for inspection instrument and inspection instrument
OHT INC62 citations94
US6710607B2Mar 23, 2004
Method and apparatus for inspection
OHT INC22 citations91
US6703849B2Mar 9, 2004
Inspection apparatus, inspection method and inspection unit therefor
OHT INC15 citations83
US6859062B2Feb 22, 2005
Apparatus and method for inspecting a board used in a liquid crystal panel
OHT INC12 citations81
US7138805B2Nov 21, 2006
Device and method for inspection
OHT INC10 citations73
US6995566B2Feb 7, 2006
Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium
OHT INC10 citations73
US6958619B2Oct 25, 2005
Inspecting apparatus and inspecting method for circuit board
OHT INC7 citations73
US6842026B2Jan 11, 2005
Inspecting apparatus and inspecting method for circuit board
OHT INC9 citations73
US6734692B2May 11, 2004
Inspection apparatus and sensor
OHT INC11 citations72
US6972573B2Dec 6, 2005
Device and method for inspecting circuit board
OHT INC5 citations62
US6943559B2Sep 13, 2005
Circuit pattern inspection device, circuit pattern inspection method, and recording medium
OHT INC6 citations62
US6894515B2May 17, 2005
Inspection unit and method of manufacturing substrate
OHT INC6 citations61
US6861863B2Mar 1, 2005
Inspection apparatus for conductive patterns of a circuit board, and a holder thereof
OHT INC6 citations60
US7088107B2Aug 8, 2006
Circuit pattern inspection instrument and pattern inspection method
OHT INC4 citations58
US7049826B2May 23, 2006
Inspection device and inspection method
OHT INC1 citations51
US7332914B2Feb 19, 2008
Conductor inspection apparatus and conductor inspection method
OHT INC1 citations50
US6992493B2Jan 31, 2006
Device and method for substrate displacement detection
OHT INC0 citations41
US6952104B2Oct 4, 2005
Inspection method and apparatus for testing fine pitch traces
OHT INC0 citations41