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Inventor
HERITAGE IAN DEREK
GB
2 patents
Patents
2 patents
US7539980B1
May 26, 2009
Method and apparatus for concurrency testing within a model-based testing environment
IBM
39 citations
84
US8015277B2
Sep 6, 2011
Method and system for simulating latency between layers of multi-tier applications
IBM
8 citations
75