Inventor
WANG SHENGHAO
CN4 patents
⚠️ This page may combine multiple inventors who share the name “WANG SHENGHAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SHANGHAI INST OPTICS & FINE MECH CAS
2 patentsUS10969348B2Apr 6, 2021
Device and method for measuring in-situ time-resolved X-ray absorption spectrum
SHANGHAI INST OPTICS & FINE MECH CAS0 citations46
US11175220B2Nov 16, 2021
Surface defect measuring apparatus and method by microscopic scattering polarization imaging
SHANGHAI INST OPTICS & FINE MECH CAS0 citations45