Inventor
CHOI AHN
KR4 patents
Patents
4 patentsUS10622088B2Apr 14, 2020
Stacked memory devices, memory systems and methods of operating stacked memory devices
SAMSUNG ELECTRONICS CO LTD8 citations78
US11435397B2Sep 6, 2022
Wafer level methods of testing semiconductor devices using internally-generated test enable signals
SAMSUNG ELECTRONICS CO LTD3 citations70
US12203980B2Jan 21, 2025
Wafer level methods of testing semiconductor devices using internally-generated test enable signals
SAMSUNG ELECTRONICS CO LTD0 citations59
US11867751B2Jan 9, 2024
Wafer level methods of testing semiconductor devices using internally-generated test enable signals
SAMSUNG ELECTRONICS CO LTD0 citations59