Inventor
COOKE LAURENCE H
US92 patents
⚠️ This page may combine multiple inventors who share the name “COOKE LAURENCE H”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
COOKE LAURENCE H
9 patentsUS8339824B2Dec 25, 2012
Nearest neighbor serial content addressable memory
COOKE LAURENCE H413 citations99
US9164559B2Oct 20, 2015
Low power semi-reflective display
COOKE LAURENCE H4 citations84
US8656143B2Feb 18, 2014
Variable clocked heterogeneous serial array processor
COOKE LAURENCE H5 citations84
US8593191B1Nov 26, 2013
Aligning multiple chip input signals using digital phase lock loops
COOKE LAURENCE H6 citations84
US8166278B2Apr 24, 2012
Hashing and serial decoding techniques
COOKE LAURENCE H13 citations84
US7818538B2Oct 19, 2010
Hashing and serial decoding techniques
COOKE LAURENCE H5 citations74
US9960480B2May 1, 2018
Solar antenna array and its fabrication
COOKE LAURENCE H2 citations73
US9846656B2Dec 19, 2017
Secure computing
COOKE LAURENCE H2 citations73
US8907707B2Dec 9, 2014
Aligning multiple chip input signals using digital phase lock loops
COOKE LAURENCE H4 citations73
CADENCE DESIGN SYSTEMS INC
9 patentsUS6701474B2Mar 2, 2004
System and method for testing integrated circuits
CADENCE DESIGN SYSTEMS INC85 citations98
US6631504B2Oct 7, 2003
Hierarchical test circuit structure for chips with multiple circuit blocks
CADENCE DESIGN SYSTEMS INC122 citations97
US6968514B2Nov 22, 2005
Block based design methodology with programmable components
CADENCE DESIGN SYSTEMS INC67 citations96
US6886121B2Apr 26, 2005
Hierarchical test circuit structure for chips with multiple circuit blocks
CADENCE DESIGN SYSTEMS INC60 citations96
US7181705B2Feb 20, 2007
Hierarchical test circuit structure for chips with multiple circuit blocks
CADENCE DESIGN SYSTEMS INC32 citations92
US6901562B2May 31, 2005
Adaptable circuit blocks for use in multi-block chip design
CADENCE DESIGN SYSTEMS INC19 citations92
US6651237B2Nov 18, 2003
System and method for H-Tree clocking layout
CADENCE DESIGN SYSTEMS INC26 citations92
US7249340B2Jul 24, 2007
Adaptable circuit blocks for use in multi-block chip design
CADENCE DESIGN SYSTEMS INC9 citations74
US7100124B2Aug 29, 2006
Interface configurable for use with target/initiator signals
CADENCE DESIGN SYSTEMS INC10 citations72
CROSSPOINT SOLUTIONS INC
8 patentsUS5347519ASep 13, 1994
Preprogramming testing in a field programmable gate array
CROSSPOINT SOLUTIONS INC128 citations99
US5221865AJun 22, 1993
Programmable input/output buffer circuit with test capability
CROSSPOINT SOLUTIONS INC134 citations99
US5534798AJul 9, 1996
Multiplexer with level shift capabilities
CROSSPOINT SOLUTIONS INC81 citations96
US5777887AJul 7, 1998
FPGA redundancy
CROSSPOINT SOLUTIONS INC57 citations95
US5623501AApr 22, 1997
Preprogramming testing in a field programmable gate array
CROSSPOINT SOLUTIONS INC23 citations93
US5313119AMay 17, 1994
Field programmable gate array
CROSSPOINT SOLUTIONS INC94 citations93
US5671234ASep 23, 1997
Programmable input/output buffer circuit with test capability
CROSSPOINT SOLUTIONS INC26 citations92
US5887002AMar 23, 1999
Preprogramming testing in a field programmable gate array
CROSSPOINT SOLUTIONS INC13 citations82
ON CHIP TECHNOLOGIES INC
8 patentsUS6687865B1Feb 3, 2004
On-chip service processor for test and debug of integrated circuits
ON CHIP TECHNOLOGIES INC110 citations98
US7197681B2Mar 27, 2007
Accelerated scan circuitry and method for reducing scan test data volume and execution time
ON CHIP TECHNOLOGIES INC39 citations95
US7353470B2Apr 1, 2008
Variable clocked scan test improvements
ON CHIP TECHNOLOGIES INC27 citations92
US7200784B2Apr 3, 2007
Accelerated scan circuitry and method for reducing scan test data volume and execution time
ON CHIP TECHNOLOGIES INC26 citations92
US7188286B2Mar 6, 2007
Accelerated scan circuitry and method for reducing scan test data volume and execution time
ON CHIP TECHNOLOGIES INC32 citations92
US6964001B2Nov 8, 2005
On-chip service processor
ON CHIP TECHNOLOGIES INC12 citations92
US7234092B2Jun 19, 2007
Variable clocked scan test circuitry and method
ON CHIP TECHNOLOGIES INC9 citations74
US7080301B2Jul 18, 2006
On-chip service processor
ON CHIP TECHNOLOGIES INC8 citations73
(unassigned)
2 patentsNOVASOLIX INC
2 patentsDERVISOGLU BULENT I
2 patentsFUJITSU LTD
2 patentsINTEL CORP
1 patentCHAMELEON SYSTEMS INC
1 patentCASIC CORP
1 patentCHAMELEON SYSTEMS
1 patentVERTEX SEMICONDUCTOR CORP
1 patentINTELLECTUAL VENTURES I LLC
1 patentSTORAGE TECHNOLOGY PARTNERS
1 patentCROSSPOINT SOLUTIONS
1 patentShowing the top 50 of 92 patents by PatentIndex Score.