Inventor
IKEDA YASUYUKI
JP44 patents
⚠️ This page may combine multiple inventors who share the name “IKEDA YASUYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
OMRON TATEISI ELECTRONICS CO
20 patentsUS7742634B2Jun 22, 2010
Image processing method, three-dimensional position measuring method and image processing apparatus
OMRON TATEISI ELECTRONICS CO10 citations84
US7630539B2Dec 8, 2009
Image processing apparatus
OMRON TATEISI ELECTRONICS CO8 citations84
US7450248B2Nov 11, 2008
Three-dimensional measuring method and three-dimensional measuring apparatus
OMRON TATEISI ELECTRONICS CO11 citations84
US11830174B2Nov 28, 2023
Defect inspecting device, defect inspecting method, and storage medium
OMRON TATEISI ELECTRONICS CO2 citations72
US11301978B2Apr 12, 2022
Defect inspection device, defect inspection method, and computer readable recording medium
OMRON TATEISI ELECTRONICS CO4 citations72
US10776909B2Sep 15, 2020
Defect inspection apparatus, defect inspection method, and non-transitory computer readable medium
OMRON TATEISI ELECTRONICS CO2 citations72
US9741108B2Aug 22, 2017
Image processing apparatus and image processing system for conveyor tracking
OMRON TATEISI ELECTRONICS CO4 citations71
US9424646B2Aug 23, 2016
Control system and control method
OMRON TATEISI ELECTRONICS CO5 citations70
US9571795B2Feb 14, 2017
Image processing device and image processing program
OMRON TATEISI ELECTRONICS CO2 citations69
US12430748B2Sep 30, 2025
Image inspection device, image inspection method, and prelearned model generation device
OMRON TATEISI ELECTRONICS CO0 citations62
US10885620B2Jan 5, 2021
Neural network image processing system
OMRON TATEISI ELECTRONICS CO1 citations59
US12430742B2Sep 30, 2025
Inspection system and inspection method
OMRON TATEISI ELECTRONICS CO0 citations52
US11769248B2Sep 26, 2023
Image processing device, image processing method, and image processing non-transitory computer readable medium for verifying detectable range of defect image
OMRON TATEISI ELECTRONICS CO0 citations51
US11574397B2Feb 7, 2023
Image processing device, image processing method, and computer readable recording medium
OMRON TATEISI ELECTRONICS CO0 citations51
US8559704B2Oct 15, 2013
Three-dimensional vision sensor
OMRON TATEISI ELECTRONICS CO0 citations51
US9998683B2Jun 12, 2018
Image processing device and image processing program
OMRON TATEISI ELECTRONICS CO1 citations48
US9607234B2Mar 28, 2017
Method and apparatus for processing images, and storage medium storing the program
OMRON TATEISI ELECTRONICS CO0 citations48
US10824906B2Nov 3, 2020
Image processing device, non-transitory computer readable storage medium, and image processing system
OMRON TATEISI ELECTRONICS CO0 citations42
US9672628B2Jun 6, 2017
Method for partitioning area, and inspection device
OMRON TATEISI ELECTRONICS CO0 citations41
US7791750B2Sep 7, 2010
Image processing system, method of controlling the image processing system, and program for a peripheral apparatus in the system
OMRON TATEISI ELECTRONICS CO0 citations40
FUJIEDA SHIRO
6 patentsUS8295588B2Oct 23, 2012
Three-dimensional vision sensor
FUJIEDA SHIRO18 citations92
US8564655B2Oct 22, 2013
Three-dimensional measurement method and three-dimensional measurement apparatus
FUJIEDA SHIRO9 citations83
US8447097B2May 21, 2013
Calibration apparatus and method for assisting accuracy confirmation of parameter for three-dimensional measurement
FUJIEDA SHIRO7 citations83
US8565515B2Oct 22, 2013
Three-dimensional recognition result displaying method and three-dimensional visual sensor
FUJIEDA SHIRO5 citations72
US8280151B2Oct 2, 2012
Method for displaying recognition result obtained by three-dimensional visual sensor and three-dimensional visual sensor
FUJIEDA SHIRO4 citations62
US8208718B2Jun 26, 2012
Method for deriving parameter for three-dimensional measurement processing and three-dimensional visual sensor
FUJIEDA SHIRO1 citations51
IKEDA YASUYUKI
6 patentsUS8233041B2Jul 31, 2012
Image processing device and image processing method for performing three dimensional measurements
IKEDA YASUYUKI8 citations83
US8237815B2Aug 7, 2012
Image processing apparatus, control method therefor, for suppressing deterioration of image quality caused by a foreign substance
IKEDA YASUYUKI2 citations61
US8692898B2Apr 8, 2014
Image capture apparatus for encrypting image data using a first encryption method or a second encryption method based on an instruction
IKEDA YASUYUKI1 citations51
US9223957B2Dec 29, 2015
Image forming apparatus, image processing apparatus and image delivery system
IKEDA YASUYUKI0 citations40
US8953197B2Feb 10, 2015
Image processing system, image inputting apparatus, display controlling apparatus, management method and program for image processing system, and storage medium
IKEDA YASUYUKI0 citations40
US8648895B2Feb 11, 2014
Method and apparatus for performing three-dimensional measurement
IKEDA YASUYUKI0 citations40
CANON KK
4 patentsUS7893984B2Feb 22, 2011
Image capturing apparatus, method of controlling the same, and program
CANON KK9 citations84
US6289127B1Sep 11, 2001
Information processing apparatus and method
CANON KK8 citations74
US8035699B2Oct 11, 2011
Image capturing apparatus, control method therefor, and program
CANON KK2 citations63
US9369698B2Jun 14, 2016
Imaging apparatus and method for controlling same
CANON KK1 citations52