Inventor
KURITA MASASHI
JP13 patents
Patents
13 patentsUS11830174B2Nov 28, 2023
Defect inspecting device, defect inspecting method, and storage medium
OMRON TATEISI ELECTRONICS CO2 citations72
US11301978B2Apr 12, 2022
Defect inspection device, defect inspection method, and computer readable recording medium
OMRON TATEISI ELECTRONICS CO4 citations72
US10776909B2Sep 15, 2020
Defect inspection apparatus, defect inspection method, and non-transitory computer readable medium
OMRON TATEISI ELECTRONICS CO2 citations72
US11240441B2Feb 1, 2022
Method, device, system and computer-program product for setting lighting condition and storage medium
OMRON TATEISI ELECTRONICS CO4 citations71
US11176650B2Nov 16, 2021
Data generation apparatus, data generation method, and data generation program
OMRON TATEISI ELECTRONICS CO4 citations71
US10885618B2Jan 5, 2021
Inspection apparatus, data generation apparatus, data generation method, and data generation program
OMRON TATEISI ELECTRONICS CO4 citations71
US10878283B2Dec 29, 2020
Data generation apparatus, data generation method, and data generation program
OMRON TATEISI ELECTRONICS CO3 citations71
US9189694B2Nov 17, 2015
Image processing device and image processing method
OMRON TATEISI ELECTRONICS CO6 citations69
US12217411B2Feb 4, 2025
Inspection apparatus, unit selection apparatus, inspection method, and computer-readable storage medium storing an inspection program
OMRON TATEISI ELECTRONICS CO1 citations62
US11631230B2Apr 18, 2023
Method, device, system and computer-program product for setting lighting condition and storage medium
OMRON TATEISI ELECTRONICS CO1 citations60
US11769248B2Sep 26, 2023
Image processing device, image processing method, and image processing non-transitory computer readable medium for verifying detectable range of defect image
OMRON TATEISI ELECTRONICS CO0 citations51
US11574397B2Feb 7, 2023
Image processing device, image processing method, and computer readable recording medium
OMRON TATEISI ELECTRONICS CO0 citations51
US11461996B2Oct 4, 2022
Method, apparatus and system for determining feature data of image data, and storage medium
OMRON TATEISI ELECTRONICS CO0 citations50