Inventor
NORCOTT MAURICE HEATHCOTE
US16 patents
Patents
16 patentsUS7538565B1May 26, 2009
High density integrated circuit apparatus, test probe and methods of use thereof
IBM112 citations99
US6334247B1Jan 1, 2002
High density integrated circuit apparatus, test probe and methods of use thereof
IBM277 citations99
US6300780B1Oct 9, 2001
High density integrated circuit apparatus, test probe and methods of use thereof
IBM197 citations99
US6062879AMay 16, 2000
High density test probe with rigid surface structure
IBM150 citations99
US5821763AOct 13, 1998
Test probe for high density integrated circuits, methods of fabrication thereof and methods of use thereof
IBM349 citations99
US5785538AJul 28, 1998
High density test probe with rigid surface structure
IBM147 citations99
US6722032B2Apr 20, 2004
Method of forming a structure for electronic devices contact locations
IBM79 citations98
US6329827B1Dec 11, 2001
High density cantilevered probe for electronic devices
IBM107 citations98
US5914614AJun 22, 1999
High density cantilevered probe for electronic devices
IBM130 citations98
US5838160ANov 17, 1998
Integral rigid chip test probe
IBM99 citations98
US5811982ASep 22, 1998
High density cantilevered probe for electronic devices
IBM310 citations97
US6104201AAug 15, 2000
Method and apparatus for passive characterization of semiconductor substrates subjected to high energy (MEV) ion implementation using high-injection surface photovoltage
IBM82 citations96
US6784072B2Aug 31, 2004
Control of buried oxide in SIMOX
IBM9 citations70
US7332922B2Feb 19, 2008
Method for fabricating a structure for making contact with a device
IBM2 citations63
US6880245B2Apr 19, 2005
Method for fabricating a structure for making contact with an IC device
IBM4 citations63
US7492008B2Feb 17, 2009
Control of buried oxide in SIMOX
IBM0 citations48