Inventor · disambiguated record
Heon Cheol Kim
Also filed as: KIM HEON · KIM HEON C · KIM HEON CHEOL “PAUL” · KIM HEON-CHEOL
16 granted patents·1 pending application·445 citations·filing 1996–2023
94Inventor score
Files withSAMSUNG ELECTRONICS CO LTD9HYUNDAI MOTOR CO LTD2SILICON IMAGE INC2APPLE INC1CHONG ANDREW K1
Top patents by PatentIndex Score
17 records- 0197US7698088B2Interface test circuitry and methodsSILICON IMAGE INC·Filed 2007·Granted Apr 13, 2010·66 cites·22 claims
- 0291US5938784ALinear feedback shift register, multiple input signature register, and built-in self test circuit using such registersSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Aug 17, 1999·94 cites·12 claims
- 0390US6574757B1Integrated circuit semiconductor device having built-in self-repair circuit for embedded memory and method for repairing the memorySAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Jun 3, 2003·66 cites·19 claims
- 0488US7831877B2Circuitry to prevent peak power problems during scan shiftSILICON IMAGE INC·Filed 2007·Granted Nov 9, 2010·18 cites·16 claims
- 0583US8788886B2Verification of SoC scan dump and memory dump operationsCHONG ANDREW K·Filed 2011·Granted Jul 22, 2014·10 cites·21 claims
- 0679US6338154B2Apparatus and method for generating addresses in a built-in self memory testing circuitSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Jan 8, 2002·46 cites·37 claims
- 0776US6769084B2Built-in self test circuit employing a linear feedback shift registerSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Jul 27, 2004·23 cites·13 claims
- 0874US5844914ATest circuit and method for refresh and descrambling in an integrated memory circuitSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Dec 1, 1998·42 cites·8 claims
- 0969US12493076B2Scan data transfer circuits for multi-die chip testingAPPLE INC·Filed 2023·Granted Dec 9, 2025·0 cites·20 claims
- 1069US6553530B1Integrated circuit devices that include self-test apparatus for testing a plurality of functional blocks and methods of testing sameSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Apr 22, 2003·36 cites·27 claims
- 1165US9590435B2Battery charging status indicator for electric vehicleHYUNDAI MOTOR CO LTD·Filed 2015·Granted Mar 7, 2017·1 cites·11 claims
- 1263US10725236B2Light cylinder, dispenser, and light cylinder manufacturing methodHATBIT ILLUCOM CO LTD·Filed 2015·Granted Jul 28, 2020·2 cites·4 claims
- 1363US2024231117A1Optical disc unit for ultraviolet sterilizer, method of manufacturing the same, and ultraviolet sterilizer including the sameHYUNDAI MOTOR CO LTD·Filed 2023·Application pending·0 cites
- 1457US6148426AApparatus and method for generating addresses in a SRAM built-in self test circuit using a single-direction counterSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Nov 14, 2000·22 cites·20 claims
- 1547US5754758ASerial memory interface using interlaced scanSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted May 19, 1998·13 cites·12 claims
- 1634US9977170B2Light cylinder and light device using the sameKIM HEON CHEOL·Filed 2015·Granted May 22, 2018·0 cites·12 claims
- 1732US5706293AMethod of testing single-order address memorySAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Jan 6, 1998·6 cites·1 claims
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