P

Inventor

TSUKADA HISASHI

JP51 patents
⚠️ This page may combine multiple inventors who share the name “TSUKADA HISASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOPCON CORP

41 patents
US7789511B2Sep 7, 2010

Eye movement measuring apparatus, eye movement measuring method and recording medium

TOPCON CORP23 citations93
US7777893B2Aug 17, 2010

Optical image measurement device

TOPCON CORP17 citations92
US7756311B2Jul 13, 2010

Optical image measuring device, optical image measuring program, fundus observation device, and fundus observation program

TOPCON CORP21 citations92
US7643154B2Jan 5, 2010

Optical image measurement device

TOPCON CORP31 citations92
US7641338B2Jan 5, 2010

Fundus observation device

TOPCON CORP19 citations92
US7604351B2Oct 20, 2009

Optical image measurement device and optical image measurement method

TOPCON CORP33 citations92
US7566128B2Jul 28, 2009

Fundus observation device, fundus image display device and fundus observation program

TOPCON CORP35 citations92
US7527378B2May 5, 2009

Fundus observation device

TOPCON CORP21 citations92
US7492466B2Feb 17, 2009

Optical image measuring apparatus and optical image measuring method

TOPCON CORP35 citations92
US7372578B2May 13, 2008

Optical image measuring apparatus

TOPCON CORP25 citations92
US7248371B2Jul 24, 2007

Optical image measuring apparatus

TOPCON CORP21 citations92
US7980697B2Jul 19, 2011

Fundus oculi observation device and ophthalmic image display device

TOPCON CORP11 citations84
US7905597B2Mar 15, 2011

Fundus observation device and a program controlling the same

TOPCON CORP10 citations84
US7905596B2Mar 15, 2011

Fundus observation device, an ophthalmologic image processing unit, an ophthalmologic image processing program, and an ophthalmologic image processing method

TOPCON CORP12 citations84
US7549746B2Jun 23, 2009

Fundus observation device

TOPCON CORP11 citations84
US7548320B2Jun 16, 2009

Optical image measuring apparatus

TOPCON CORP16 citations84
US7458684B2Dec 2, 2008

Fundus observation device

TOPCON CORP16 citations84
US7268885B2Sep 11, 2007

Optical image measuring apparatus for forming an image of an object to be measured based on interference light

TOPCON CORP19 citations84
US7794083B2Sep 14, 2010

Fundus oculi observation device and fundus oculi image display device

TOPCON CORP15 citations83
US8348426B2Jan 8, 2013

Optical image measurement device and image processing device

TOPCON CORP6 citations73
US5694197ADec 2, 1997

Corneal shape measuring apparatus

TOPCON CORP13 citations72
US5903334AMay 11, 1999

Ophthalmologic apparatus and ophthalmologic-data management system for identifying a type of measuring instrument from ophthalmologic data and managing ophthalmologic data according to measuring instrument type

TOPCON CORP9 citations71
US11754516B2Sep 12, 2023

Nondestructive test system comprising a neutron emission unit for emitting fast neutrons and a neutron detection unit for detecting thermal neutrons, and nondestructive test method

TOPCON CORP2 citations70
US12468135B2Nov 11, 2025

Slit lamp microscope

TOPCON CORP0 citations63
US12226160B2Feb 18, 2025

Method of processing optical coherence tomography (OCT) data, method of OCT imaging, and OCT data processing apparatus

TOPCON CORP0 citations63
US11849996B2Dec 26, 2023

Method of processing optical coherence tomography (OCT) data, method of OCT imaging, and OCT data processing apparatus

TOPCON CORP0 citations63
US11617505B2Apr 4, 2023

Ophthalmic system, ophthalmic information processing device, and ophthalmic diagnosing method

TOPCON CORP1 citations63
US11375892B2Jul 5, 2022

Method of processing optical coherence tomography (OCT) data and OCT data processing apparatus

TOPCON CORP0 citations63
US11229355B2Jan 25, 2022

Method of optical coherence tomography (OCT) imaging, method of processing OCT data, and OCT apparatus

TOPCON CORP0 citations63
US8009297B2Aug 30, 2011

Optical image measuring apparatus

TOPCON CORP3 citations63
US7982880B2Jul 19, 2011

Optical image measurement device

TOPCON CORP3 citations63
US7837328B2Nov 23, 2010

Optical image-measuring device

TOPCON CORP3 citations63
US7245383B2Jul 17, 2007

Optical image measuring apparatus for obtaining a signal intensity and spatial phase distribution of interference light

TOPCON CORP6 citations63
US7241982B2Jul 10, 2007

Optical image transmitting system, optical image transmitting apparatus, optical image receiving apparatus, and optical image transmitting method

TOPCON CORP2 citations63
US11747288B2Sep 5, 2023

Non-destructive inspection system comprising neutron radiation source and neutron radiation method

TOPCON CORP0 citations59
US12543950B2Feb 10, 2026

Slit lamp microscope, ophthalmic information processing apparatus, ophthalmic system, method of controlling slit lamp microscope, and recording medium

TOPCON CORP0 citations52
US12539039B2Feb 3, 2026

Slit lamp microscope

TOPCON CORP0 citations52
US12478252B2Nov 25, 2025

Slit lamp microscope, ophthalmic system, method of controlling slit lamp microscope, and recording medium

TOPCON CORP0 citations52
US11950849B2Apr 9, 2024

Ophthalmic system, ophthalmic information processing apparatus, and recording medium

TOPCON CORP0 citations52
US10881295B2Jan 5, 2021

Ophthalmic system, ophthalmic information processing apparatus, and ophthalmic information processing method

TOPCON CORP0 citations52
US12262948B2Apr 1, 2025

Microscope and function expansion unit

TOPCON CORP0 citations51

KK TOPCON

5 patents

JAPAN STEEL WORKS LTD

2 patents

3 D MATRIX LTD

1 patent

CANON USA INC

1 patent

Showing the top 50 of 51 patents by PatentIndex Score.