Inventor
PLIES ERICH
DE22 patents
⚠️ This page may combine multiple inventors who share the name “PLIES ERICH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SIEMENS AG
21 patentsUS5247392ASep 21, 1993
Objective lens for producing a radiation focus in the inside of a specimen
SIEMENS AG41 citations92
US5146090ASep 8, 1992
Particle beam apparatus having an immersion lens arranged in an intermediate image of the beam
SIEMENS AG39 citations92
US4963823AOct 16, 1990
Electron beam measuring instrument
SIEMENS AG24 citations92
US4785176ANov 15, 1988
Electrostatic-magnetic lens for particle beam apparatus
SIEMENS AG48 citations92
US4769543ASep 6, 1988
Spectrometer lens for particle beam apparatus
SIEMENS AG27 citations92
US4728790AMar 1, 1988
Low-abberation spectrometer objective with high secondary electron acceptance
SIEMENS AG34 citations92
US4514638AApr 30, 1985
Electron-optical system with variable-shaped beam for generating and measuring microstructures
SIEMENS AG31 citations92
US4540885ASep 10, 1985
Spectrometer objective having parallel objective fields and spectrometer fields for the potential measuring technique
SIEMENS AG28 citations91
US5661400AAug 26, 1997
Antenna for nuclear magnetic resonance tomography
SIEMENS AG45 citations87
US4684808AAug 4, 1987
Scanning system for a particle beam scanning apparatus
SIEMENS AG51 citations87
US4551625ANov 5, 1985
Spectrometer objective for particle beam measurement technique
SIEMENS AG22 citations82
US4464571AAug 7, 1984
Opposing field spectrometer for electron beam mensuration technology
SIEMENS AG24 citations82
US5616920AApr 1, 1997
Apparatus for removing ions from an electron beam
SIEMENS AG16 citations74
US4788495ANov 29, 1988
Method for the indirect identification of the intensity distribution of particle beam pulses generated in a particle beam measuring instrument
SIEMENS AG11 citations74
US4629899ADec 16, 1986
Deflection lens system for generating a beam of neutral particles of variable cross section
SIEMENS AG17 citations74
US4439685AMar 27, 1984
Corpuscular beam blanking system
SIEMENS AG18 citations74
US4393308AJul 12, 1983
High current electron source
SIEMENS AG10 citations70
US5030829AJul 9, 1991
Method and apparatus for investigating latch-up propagation in complementary-metal-oxide-semiconductor (CMOS) circuits
SIEMENS AG9 citations69
US5012100AApr 30, 1991
Method and apparatus for investigating the latch-up propagation in complementary-metal-oxide semiconductor (CMOS) circuits
SIEMENS AG11 citations69
US4507559AMar 26, 1985
Deflection structure for a corpuscular beam blanking system and method for operating same
SIEMENS AG2 citations63
US4748324AMay 31, 1988
Electrostatic opposing field spectrometer for electron beam test methods
SIEMENS AG0 citations37