Inventor
VAN RIEL MARTINUS CORNELIUS JOHANNES MARIA
NL4 patents
Patents
4 patentsUS11402405B2Aug 2, 2022
Frequency tracking for subsurface atomic force microscopy
TNO0 citations58
US11320454B2May 3, 2022
Scanning probe microscopy system for and method of mapping nanostructures on the surface of a sample
TNO0 citations48
US11067597B2Jul 20, 2021
Method of performing atomic force microscopy with an ultrasound transducer
TNO0 citations48
US11035879B2Jun 15, 2021
Z-position motion stage for use in a scanning probe microscopy system, scan head and method of manufacturing
TNO0 citations40