Inventor
STOEHR ROLAND
DE9 patents
⚠️ This page may combine multiple inventors who share the name “STOEHR ROLAND”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
8 patentsUS4843315AJun 27, 1989
Contact probe arrangement for electrically connecting a test system to the contact pads of a device to be tested
IBM45 citations90
US4686464AAug 11, 1987
Buckling beam test probe assembly
IBM31 citations86
US5296091AMar 22, 1994
Method of etching substrates having a low thermal conductivity
IBM17 citations80
US6356089B2Mar 12, 2002
Contact probe arrangement
IBM11 citations73
US5304278AApr 19, 1994
Apparatus for plasma or reactive ion etching and method of etching substrates having a low thermal conductivity
IBM8 citations71
US5532657AJul 2, 1996
High speed coaxial contact and signal transmission element
IBM11 citations65
US5939893AAug 17, 1999
Contact probe arrangement for functional electrical testing
IBM4 citations61
US5863636AJan 26, 1999
Adhesive bond for densely ordered elements
IBM2 citations61