P

Inventor

KNIERIM DANIEL G

US80 patents
⚠️ This page may combine multiple inventors who share the name “KNIERIM DANIEL G”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TEKTRONIX INC

47 patents
US5382955AJan 17, 1995

Error tolerant thermometer-to-binary encoder

TEKTRONIX INC87 citations96
US5399988AMar 21, 1995

FT doubler amplifier

TEKTRONIX INC26 citations93
US4733220AMar 22, 1988

Thermometer-to-adjacent bindary encoder

TEKTRONIX INC49 citations93
US4586025AApr 29, 1986

Error tolerant thermometer-to-binary encoder

TEKTRONIX INC35 citations93
US6642741B2Nov 4, 2003

Electronically adjustable integrated circuit input/output termination method and apparatus

TEKTRONIX INC29 citations92
US6255866B1Jul 3, 2001

Digital phase analyzer and synthesizer

TEKTRONIX INC29 citations92
US5986637ANov 16, 1999

Digital oscilloscope architecture for signal monitoring with enhanced duty cycle

TEKTRONIX INC35 citations92
US5627500AMay 6, 1997

Phase modulator having individually placed edges

TEKTRONIX INC32 citations92
US5530454AJun 25, 1996

Digital oscilloscope architecture for signal monitoring with enhanced duty cycle

TEKTRONIX INC37 citations92
US4613950ASep 23, 1986

Self-calibrating time interval meter

TEKTRONIX INC28 citations91
US7191079B2Mar 13, 2007

Oscilloscope having advanced triggering capability

TEKTRONIX INC35 citations90
US5459466AOct 17, 1995

Method and apparatus for converting a thermometer code to a gray code

TEKTRONIX INC25 citations90
US4873456AOct 10, 1989

High speed state machine

TEKTRONIX INC43 citations87
US4843309AJun 27, 1989

Waveform timing alignment system for digital oscilloscopes

TEKTRONIX INC46 citations87
US10041975B2Aug 7, 2018

Automatic probe ground connection checking techniques

TEKTRONIX INC4 citations84
US9194888B2Nov 24, 2015

Automatic probe ground connection checking techniques

TEKTRONIX INC7 citations84
US8723530B2May 13, 2014

Signal acquisition system having reduced probe loading of a device under test

TEKTRONIX INC13 citations82
US8384411B2Feb 26, 2013

Method and device for measuring inter-chip signals

TEKTRONIX INC19 citations77
US7071787B2Jul 4, 2006

Method and apparatus for the reduction of phase noise

TEKTRONIX INC10 citations74
US5418533AMay 23, 1995

Method and circuit for conditioning a signal for use in systems having analog-to-digital converter circuits

TEKTRONIX INC7 citations74
US4975880ADec 4, 1990

Memory system for storing data from variable numbers of input data streams

TEKTRONIX INC14 citations74
US4903285AFeb 20, 1990

Efficiency shift register

TEKTRONIX INC8 citations74
US11146280B2Oct 12, 2021

Digital signal processing waveform synthesis for fixed sample rate signal sources

TEKTRONIX INC2 citations73
US10859598B1Dec 8, 2020

Back-drilled via attachment technique using a UV-cure conductive adhesive

TEKTRONIX INC6 citations73
US10365300B2Jul 30, 2019

Trigger on final occurrence

TEKTRONIX INC2 citations73
US10330705B2Jun 25, 2019

Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing

TEKTRONIX INC2 citations73
US10225022B2Mar 5, 2019

Electro-optic sensor system

TEKTRONIX INC2 citations73
US9525427B1Dec 20, 2016

Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing and a linear time-periodic filter

TEKTRONIX INC4 citations73
US9432042B2Aug 30, 2016

Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing

TEKTRONIX INC4 citations73
US6563365B2May 13, 2003

Low-noise four-quadrant multiplier method and apparatus

TEKTRONIX INC8 citations73
US11002764B2May 11, 2021

Systems and methods for synchronizing multiple test and measurement instruments

TEKTRONIX INC3 citations72
US10996178B2May 4, 2021

Analog signal isolator

TEKTRONIX INC1 citations72
US9306590B2Apr 5, 2016

Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing

TEKTRONIX INC4 citations72
US7035325B2Apr 25, 2006

Jitter measurement using mixed down topology

TEKTRONIX INC8 citations72
US6720828B2Apr 13, 2004

Apparatus and method for compensating a high impedance attenuator

TEKTRONIX INC8 citations71
US11187720B2Nov 30, 2021

Test and measurement devices, systems, and methods associated with augmented reality

TEKTRONIX INC2 citations70
US10145822B2Dec 4, 2018

Tri-mode probe with automatic skew adjustment

TEKTRONIX INC2 citations65
US12442838B2Oct 14, 2025

Current monitor combining a shunt resistor with a Rogowski coil

TEKTRONIX INC0 citations63
US11619697B2Apr 4, 2023

Calibration of magnetic field sensor for current probe

TEKTRONIX INC0 citations63
US7983332B2Jul 19, 2011

Eye violation and excess jitter trigger

TEKTRONIX INC2 citations63
US5406507AApr 11, 1995

Reduced input capacitance analog storage array

TEKTRONIX INC6 citations63
US12493053B2Dec 9, 2025

Precision, high bandwidth, switching attenuator

TEKTRONIX INC0 citations62
US12235291B2Feb 25, 2025

Current shunt probe

TEKTRONIX INC0 citations62
US11808786B2Nov 7, 2023

Precision, high bandwidth, switching attenuator

TEKTRONIX INC0 citations62
US11552620B2Jan 10, 2023

Event activity trigger

TEKTRONIX INC0 citations62
US11454651B2Sep 27, 2022

Automatic probe ground connection checking techniques

TEKTRONIX INC0 citations62
US11372025B2Jun 28, 2022

Systems and methods for synchronizing multiple test and measurement instruments

TEKTRONIX INC0 citations62

TRIQUINT SEMICONDUCTOR INC

1 patent

BARTLETT JOSIAH A

1 patent

KNIERIM DANIEL G

1 patent

Showing the top 50 of 80 patents by PatentIndex Score.