Inventor
KNIERIM DANIEL G
US80 patents
⚠️ This page may combine multiple inventors who share the name “KNIERIM DANIEL G”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEKTRONIX INC
47 patentsUS5382955AJan 17, 1995
Error tolerant thermometer-to-binary encoder
TEKTRONIX INC87 citations96
US5399988AMar 21, 1995
FT doubler amplifier
TEKTRONIX INC26 citations93
US4733220AMar 22, 1988
Thermometer-to-adjacent bindary encoder
TEKTRONIX INC49 citations93
US4586025AApr 29, 1986
Error tolerant thermometer-to-binary encoder
TEKTRONIX INC35 citations93
US6642741B2Nov 4, 2003
Electronically adjustable integrated circuit input/output termination method and apparatus
TEKTRONIX INC29 citations92
US6255866B1Jul 3, 2001
Digital phase analyzer and synthesizer
TEKTRONIX INC29 citations92
US5986637ANov 16, 1999
Digital oscilloscope architecture for signal monitoring with enhanced duty cycle
TEKTRONIX INC35 citations92
US5627500AMay 6, 1997
Phase modulator having individually placed edges
TEKTRONIX INC32 citations92
US5530454AJun 25, 1996
Digital oscilloscope architecture for signal monitoring with enhanced duty cycle
TEKTRONIX INC37 citations92
US4613950ASep 23, 1986
Self-calibrating time interval meter
TEKTRONIX INC28 citations91
US7191079B2Mar 13, 2007
Oscilloscope having advanced triggering capability
TEKTRONIX INC35 citations90
US5459466AOct 17, 1995
Method and apparatus for converting a thermometer code to a gray code
TEKTRONIX INC25 citations90
US4873456AOct 10, 1989
High speed state machine
TEKTRONIX INC43 citations87
US4843309AJun 27, 1989
Waveform timing alignment system for digital oscilloscopes
TEKTRONIX INC46 citations87
US10041975B2Aug 7, 2018
Automatic probe ground connection checking techniques
TEKTRONIX INC4 citations84
US9194888B2Nov 24, 2015
Automatic probe ground connection checking techniques
TEKTRONIX INC7 citations84
US8723530B2May 13, 2014
Signal acquisition system having reduced probe loading of a device under test
TEKTRONIX INC13 citations82
US8384411B2Feb 26, 2013
Method and device for measuring inter-chip signals
TEKTRONIX INC19 citations77
US7071787B2Jul 4, 2006
Method and apparatus for the reduction of phase noise
TEKTRONIX INC10 citations74
US5418533AMay 23, 1995
Method and circuit for conditioning a signal for use in systems having analog-to-digital converter circuits
TEKTRONIX INC7 citations74
US4975880ADec 4, 1990
Memory system for storing data from variable numbers of input data streams
TEKTRONIX INC14 citations74
US4903285AFeb 20, 1990
Efficiency shift register
TEKTRONIX INC8 citations74
US11146280B2Oct 12, 2021
Digital signal processing waveform synthesis for fixed sample rate signal sources
TEKTRONIX INC2 citations73
US10859598B1Dec 8, 2020
Back-drilled via attachment technique using a UV-cure conductive adhesive
TEKTRONIX INC6 citations73
US10365300B2Jul 30, 2019
Trigger on final occurrence
TEKTRONIX INC2 citations73
US10330705B2Jun 25, 2019
Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing
TEKTRONIX INC2 citations73
US10225022B2Mar 5, 2019
Electro-optic sensor system
TEKTRONIX INC2 citations73
US9525427B1Dec 20, 2016
Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing and a linear time-periodic filter
TEKTRONIX INC4 citations73
US9432042B2Aug 30, 2016
Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing
TEKTRONIX INC4 citations73
US6563365B2May 13, 2003
Low-noise four-quadrant multiplier method and apparatus
TEKTRONIX INC8 citations73
US11002764B2May 11, 2021
Systems and methods for synchronizing multiple test and measurement instruments
TEKTRONIX INC3 citations72
US10996178B2May 4, 2021
Analog signal isolator
TEKTRONIX INC1 citations72
US9306590B2Apr 5, 2016
Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing
TEKTRONIX INC4 citations72
US7035325B2Apr 25, 2006
Jitter measurement using mixed down topology
TEKTRONIX INC8 citations72
US6720828B2Apr 13, 2004
Apparatus and method for compensating a high impedance attenuator
TEKTRONIX INC8 citations71
US11187720B2Nov 30, 2021
Test and measurement devices, systems, and methods associated with augmented reality
TEKTRONIX INC2 citations70
US10145822B2Dec 4, 2018
Tri-mode probe with automatic skew adjustment
TEKTRONIX INC2 citations65
US12442838B2Oct 14, 2025
Current monitor combining a shunt resistor with a Rogowski coil
TEKTRONIX INC0 citations63
US11619697B2Apr 4, 2023
Calibration of magnetic field sensor for current probe
TEKTRONIX INC0 citations63
US7983332B2Jul 19, 2011
Eye violation and excess jitter trigger
TEKTRONIX INC2 citations63
US5406507AApr 11, 1995
Reduced input capacitance analog storage array
TEKTRONIX INC6 citations63
US12493053B2Dec 9, 2025
Precision, high bandwidth, switching attenuator
TEKTRONIX INC0 citations62
US12235291B2Feb 25, 2025
Current shunt probe
TEKTRONIX INC0 citations62
US11808786B2Nov 7, 2023
Precision, high bandwidth, switching attenuator
TEKTRONIX INC0 citations62
US11552620B2Jan 10, 2023
Event activity trigger
TEKTRONIX INC0 citations62
US11454651B2Sep 27, 2022
Automatic probe ground connection checking techniques
TEKTRONIX INC0 citations62
US11372025B2Jun 28, 2022
Systems and methods for synchronizing multiple test and measurement instruments
TEKTRONIX INC0 citations62
TRIQUINT SEMICONDUCTOR INC
1 patentBARTLETT JOSIAH A
1 patentKNIERIM DANIEL G
1 patentShowing the top 50 of 80 patents by PatentIndex Score.